Patents Assigned to EYETECH CO., LTD.
  • SYSTEM FOR NON-DESTRUCTIVELY INSPECTING BAGGAGE, METHOD FOR NONDESTRUCTIVELY INSPECTING BAGGAGE, PROGRAM, AND RECORDING MEDIUM
    Publication number: 20220381706
    Abstract: Provided are a system for non-destructively inspecting baggage, a method for non-destructively inspecting baggage, a program, and a recording medium in which an inspection that corresponds to the owner of an article to be inspected is performed even when the article to be inspected overlaps various objects including similar materials, whereby the system, method, program, and recording medium are efficient and do not exhibit any oversight in inspection.
    Type: Application
    Filed: September 30, 2020
    Publication date: December 1, 2022
    Applicants: EYETECH CO., LTD., NIPPON SIGNAL CO., LTD.
    Inventors: YOSUKE TSUJI, SHINYA SAITO, TATSURO HAYASHI, EISHI KAWASAKI, MASAKI TAKAHASHI, KAZUAKI TAKAYAMA