Abstract: A test apparatus and a method for operating a data processing system to generate a test signal for testing a DUT are disclosed. The apparatus includes a signal generator, artificial neural network, and controller. The signal generator generates a test signal determined by a plurality of signal generator input parameters, X, that are coupled thereto. The test signal is characterized by a plurality of calculated parameters, Y. The artificial neural network has the calculated parameters as inputs and a plurality of outputs connected to the plurality of signal generator inputs. The controller receives desired values for the calculated parameters and couples those desired values to the neural network inputs, thereby causing the test signal generator to generate a test signal having the desired values for the calculated parameters.