Abstract: The invention provides a measurement system to interrogate at least one birefringent optical sensor and a method to interrogate birefringent optical sensors at high speed and high resolution. The system and method detects, at least, a first and a second spectral feature that are polarization dependent, wherein the detected first and second spectral features correspond to different responses of at least one birefringent optical sensor.
Type:
Grant
Filed:
March 21, 2016
Date of Patent:
September 24, 2019
Assignee:
FAZ TECHNOLOGY LTD.
Inventors:
Selwan K. Ibrahim, John O'Dowd, Devrez Mehmet Karabacak