Abstract: A system and method is provided for reading a test strip by measuring the light intensity incident on a photodiode. The method may include reverse biasing the photodiode, measuring a time required to charge a capacitor using current generated by the photodiode, and using the time required to charge the capacitor to determine a condition of the test strip. The system may include a photodiode being reverse biased and a capacitor being charged by the reversed biased photodiode. The length of time to charge the capacitor may be proportional to the light intensity incident on the photodiode and may be used to determine a condition of the test strip.

Abstract: A system and method is disclosed which relates to reading test strips. The method may include reading and storing initial values of a front photodiode and a rear photodiode, reading current values of the front and rear photodiodes, detecting at least one change between initial and current values in the front or the rear photodiodes, comparing the detected value change of one of the photodiodes with the value of the other photodiode, and determining a condition of the test strip in response to the resulting comparison.