Abstract: A contact element system has a plurality of pin-type or needle-type and electrically conductive contact elements of equal length, which each have two end regions for electrically contacting contact positions and each have an intermediate region under longitudinal loading, overcoming their bending rigidity, and are designed with lamellar sections in the intermediate region such that they have at least two strips which are substantially parallel to each other and run at a distance from one another. At least two of the contact elements have different cross sectional surfaces and differently formed strips in the intermediate region, wherein the forms of the strips are chosen such that the contact elements have the same or approximately the same bending rigidity.

Abstract: A contact pin, in particular a spring contact pin, comprising a test head for contacting an electrically conductive contact surface of a test object, in particular a wafer, a printed circuit board or the like, and comprising a pin sleeve, in which the test head is mounted with a guide end in a longitudinally displaceable manner. At least in some sections, a flexible, deformable/deformed circuit carrier is provided, on which at least one electrical/electronic component is arranged and which is or can be axially inserted into the pin sleeve by rolling and/or folding.

Abstract: A contact pin, in particular a spring contact pin, comprising a test head for contacting an electrically conductive contact surface of a test object, in particular a wafer, a printed circuit board or the like, and comprising a pin sleeve, in which the test head is mounted with a guide end in a longitudinally displaceable manner. At least in some sections, a flexible, deformable/deformed circuit carrier is provided, on which at least one electrical/electronic component is arranged and which is or can be axially inserted into the pin sleeve by rolling and/or folding.

Abstract: A method for producing a contact spacing converter space transformer) which has electrical contacts that form electrical paths and in which a first contact spacing of the contacts is converted into a comparatively different, second contact spacing of the electrical contacts including producing at least one base part from each of at least some of the electrical contacts. At least a section of the base part is produced from plastic. The method subsequently includes metallization of at least the section of the base part that is produced from plastic.

Abstract: A contact head (6) for an electrical test device (1) for electrically testing substrates, which have electrical contact points, with at least two guide plates (13, 14) that are arranged to each other by a spacer (15) and each have guide openings (16) essentially aligned with each other for receiving pin-shaped contact elements (8) and are oriented to each other by a centering device (20), wherein the centering device (20) has four centering pins (19), which are displaceably mounted in a slot (23), extending toward a center (Z) of the contact head (6), at least of one of the guide plates (13, 14), and wherein the centering pins (19) are each held in a centering opening (18) of the spacer (15). It is provided that the centering openings (18) each have only one guide surface (21) oriented at least essentially parallel to a radial axis (R)—in relation to the center (Z).

Abstract: A contact element system has a plurality of pin-type or needle-type and electrically conductive contact elements of equal length, which each have two end regions for electrically contacting contact positions and each have an intermediate region under longitudinal loading, overcoming their bending rigidity, and are designed with lamellar sections in the intermediate region such that they have at least two strips which are substantially parallel to each other and run at a distance from one another. At least two of the contact elements have different cross sectional surfaces and differently formed strips in the intermediate region, wherein the forms of the strips are chosen such that the contact elements have the same or approximately the same bending rigidity.

Abstract: A contact module for making electrical tactile contact with a component includes a carrier having a contact side assignable to the component and a connection side facing away from the contact side, with at least two electrically conductive contact elements, of which at least one is a spring contact pin with a spring-loaded contact head, wherein free ends of the contact elements protrude from the contact side of the carrier for the purpose of making tactile contact with the component. At least one protective wall is disposed on the contact side of the carrier, the wall forming at least one contact space in which the free ends of the contact elements are disposed.

Abstract: A method for producing at least one spring contact pin acting as an electrical contact, or a spring contact pin arrangement comprises at least one such spring contact pin. The following steps are provided: producing at least one base part of the spring contact pin, at least one section of said base part being made of plastic, and subsequently metallizing at least the section of the base part that is made of plastic. The invention also relates to a spring contact pin produced to according to said method, or a spring contact pin arrangement having at least one such spring contact pin.

Abstract: A contact-distance transformer of an electric testing device for testing an electric specimen such as a wafer, for reducing a distance between neighboring electric contacts, the transformer having a non-electrically conductive supporting structure with a first side with first electric contacts positioned apart a first distance and a second side with second electric contacts positioned apart a second, smaller distance. The first contacts are connected to the second contacts by electric connections passing through the support structure and/or which are positioned on the support structure.

Abstract: A contact device for an electric contact for electrically testing an electric test object, comprising a contact head and at least one printed circuit board. The contact head has a plurality of guide bores in which elongated contact elements that buckle elastically in a lateral direction upon contacting the test object are mounted in a longitudinally movable manner. One end of the contact element is used to contact the test object and the other end is in contact with first contact surfaces which are arranged in a specified pattern and which are located on a face of the printed circuit board in a first, central region of the printed circuit board face. Second contact surfaces are arranged in a further specified pattern, are electrically connected to the first contact surfaces through the printed circuit board, and lie on the other face of the printed circuit board in a second, central region of the printed circuit board face.

Abstract: A contact head (6) for an electrical test device (1) for electrically testing substrates, which have electrical contact points, with at least two guide plates (13, 14) that are arranged to each other by a spacer (15) and each have guide openings (16) essentially aligned with each other for receiving pin-shaped contact elements (8) and are oriented to each other by a centering device (20), wherein the centering device (20) has four centering pins (19), which are displaceably mounted in a slot (23), extending toward a center (Z) of the contact head (6), at least of one of the guide plates (13, 14), and wherein the centering pins (19) are each held in a centering opening (18) of the spacer (15). It is provided that the centering openings (18) each have only one guide surface (21) oriented at least essentially parallel to a radial axis (R)—in relation to the center (Z).

Abstract: A method for producing at least one spring contact pin acting as an electrical contact, or a spring contact pin arrangement comprises at least one such spring contact pin. The following steps are provided: producing at least one base part of the spring contact pin, at least one section of said base part being made of plastic, and subsequently metallizing at least the section of the base part that is made of plastic. The invention also relates to a spring contact pin produced to according to said method, or a spring contact pin arrangement having at least one such spring contact pin.

Abstract: A method for producing a contact spacing converter space transformer) which has electrical contacts that form electrical paths and in which a first contact spacing of the contacts is converted into a comparatively different, second contact spacing of the electrical contacts including producing at least one base part from each of at least some of the electrical contacts. At least a section of the base part is produced from plastic. The method subsequently includes metallization of at least the section of the base part that is produced from plastic.

Abstract: A contact device for an electric contact for electrically testing an electric test object, comprising a contact head and at least one printed circuit board. The contact head has a plurality of guide bores in which elongated contact elements that buckle elastically in a lateral direction upon contacting the test object are mounted in a longitudinally movable manner. One end of the contact element is used to contact the test object and the other end is in contact with first contact surfaces which are arranged in a specified pattern and which are located on a face of the printed circuit board in a first, central region of the printed circuit board face. Second contact surfaces are arranged in a further specified pattern, are electrically connected to the first contact surfaces through the printed circuit board, and lie on the other face of the printed circuit board in a second, central region of the printed circuit board face.

Abstract: An electrical contacting device for electrical physical contact with a specimen, particularly wafers, taking place in a contacting direction, with at least one conductor substrate which can be electrically connected to a testing device, at least one contact distance transformer and at least one contact head having electrical contact elements, particularly resilient contact elements, preferably serving to compensate different physical contact distances existing in the contacting direction particularly at the contact elements.

Abstract: A contact-distance transformer of an electric testing device for testing an electric specimen such as a wafer, for reducing a distance between neighboring electric contacts, the transformer having a non-electrically conductive supporting structure with a first side with first electric contacts positioned apart a first distance and a second side with second electric contacts positioned apart a second, smaller distance. The first contacts are connected to the second contacts by electric connections passing through the support structure and/or which are positioned on the support structure.

Abstract: A testing device for electrically testing an electrical test specimen, in particular a wafer, the testing device having a test head in which at least one testing contact is mounted for electrically contacting a test specimen. At least one outlet opening for discharging a gas, in particular a protective gas, into a contact region, is provided in a wall of the test head.

Abstract: The present disclosure relates to a test head for electrical testing of a test specimen, in particular a wafer, having at least two guide plates, which are spaced apart by means of at least one spacer and have guide holes distributed over the surfaces thereof, in which test contact pins for physical contact with the test specimen are guided in a sliding manner. Provision is made for the spacer to be formed by a multiplicity of point supports arranged in a manner distributed over the surfaces of the guide plates and secured on the guide plates.

Abstract: An electrical contacting device for electrical physical contact with a specimen, particularly wafers, taking place in a contacting direction, with at least one conductor substrate which can be electrically connected to a testing device, at least one contact distance transformer and at least one contact head having electrical contact elements, particularly resilient contact elements, preferably serving to compensate different physical contact distances existing in the contacting direction particularly at the contact elements.

Abstract: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate which is electrically connected via a contact spacing converter to a test head. The conductor substrate is mechanically connected to a first stiffening device and is thereby stiffened. At least one spacer which penetrates the conductor substrate is mechanically connected to the contact spacing converter and is held on the first stiffening device via at least one tilt adjusting arrangement.