Abstract: The invention relates to a contact device (1) for contacting an electrical contact point of a test object, comprising a contact plunger (3), which has a plunger shaft (4) for mounting in a guide sleeve (2) in an axially displaceable manner as well as a contact head (5) which is assignable to the test object and arranged on a free end of the plunger shaft (4), and comprising at least one contact element (13), which is movably mounted on and/or in the contact head (5), whereby at least one spring element (6), which is elastically deformable against its spring force by means of the contact element (13) under a load resulting from a contact, is assigned to the contact element (13), is provided that several of the contact elements (13), which in each case have a contact area (14) for contacting, are arranged next to one another on the contact head (5) in such a way that the contact areas (14) form an at least essentially continuous contact surface (15) of the contact head (5) for the contact point in the unloaded

Abstract: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate (12) which is electrically connected via a contact spacing converter (7) to a test head (2). The conductor substrate is mechanically connected to a first stiffening device (26) and is thereby stiffened. At least one spacer (30) which penetrates the conductor substrate (12) is mechanically connected to the contact spacing converter (7) and is held on the first stiffening device (26) via at least one tilt adjusting arrangement (34).

Abstract: A contact-making apparatus for electrical connection of a unit under test to an electrical test device. The apparatus has a plurality of electrical test contacts, which are associated with at least one holding element, for making contact with the unit under test. An adapter device increases the distance between adjacent contact paths. The adapter device has contact elements for touch contact with the test contacts. The contact elements are comprised of noble metal or of a noble metal alloy, or of an alloy having at least one noble metal component, or of electrically conductive plastic. The invention also relates to a corresponding method of forming the contact elements by heating and then cooling and then forming the apparatus.

Abstract: A contact-making apparatus for electrical connection of a unit under test to an electrical test device, having a plurality of electrical contacts which are associated with at least one holding element. The contact-making apparatus and preferably the holding element thereof, is provided with at least one marking which is in a defined position with respect to at least one of the contacts. The marking is detected for alignment of the apparatus and the unit. A corresponding method of use and a method of manufacture are also disclosed.

Abstract: An elongate electrical contact element (1) for physically contacting electrical components under test, having two electrical contacting end regions (2, 3) and an elongate intermediate region (4) situated between the end regions (2, 3). The intermediate region (4) has an essentially rectangular cross-section and is configured lamellar along its longitudinal extent. Also disclosed is a corresponding contacting apparatus (22) including such a contact element (1) and a contact element holder (23).

Abstract: The invention relates to a contacting device for contacting an electrical test piece to be tested, in particular a test piece provided with tin-plated contacts, comprising at least two guide elements having openings through which contact elements pass essentially axially and which project from the test piece, on a side of the associated guide element facing the test piece, for contacting the test piece. The invention is characterized in that the axial distance between the guide elements or the axial position of the guide element facing the test piece may be adjusted to fit the projecting length.

Abstract: A contacting device for touch contacting an electrical test specimen includes a contact head and a connecting device. The contact head with the test specimen have electrically touch contactable test contacts, the positions of which are distributed across a testing surface and are determined by at least one guide element that belongs to the contact head and that is fastened to a holding device of the contact head. The test contacts, on their side facing away from the test specimen, are to be brought into electrical touch contact with contact surfaces of the connecting device. It is provided that the guide element is composed of individual segments that each have a part of the testing surface and are each connected to at least one of the holding device and the connecting device by at least one fixed bearing.

Abstract: The invention relates to an electrical test device for testing electrical test pieces comprising at least one electrical contact system and at least one electrical connecting device provided with at least one electrical/electronic component, and having contact surfaces for touch contacting of the contact system which may be contacted by the test piece, and having a wiring substrate and a connecting element; wherein the electrical/electronic component is carried by the connecting element.

Abstract: The present disclosure relates to an electrical testing device for testing electrical test samples, the electrical testing device comprising an electrical connecting device having contact surfaces for touch contacting a contact arrangement that is contactable with the test sample and to which a support device is allocated, and a middle centering device that permits only radial temperature compensation clearance using a plurality of guides for the central alignment of the support device and connecting device relative to one another.

Abstract: A contacting device for touch contacting an electrical test specimen includes a contact head and a connecting device. The contact head with the test specimen have electrically touch contactable test contacts, the positions of which are distributed across a testing surface and are determined by at least one guide element that belongs to the contact head and that is fastened to a holding device of the contact head. The test contacts, on their side facing away from the test specimen, are to be brought into electrical touch contact with contact surfaces of the connecting device. It is provided that the guide element is composed of individual segments that each have a part of the testing surface and are each connected to at least one of the holding device and the connecting device by at least one fixed bearing.

Abstract: The invention relates to a contacting device for contacting an electrical test piece to be tested, in particular a test piece provided with tin-plated contacts, comprising at least two guide elements having openings through which contact elements pass essentially axially and which project from the test piece, on a side of the associated guide element facing the test piece, for contacting the test piece. The invention is characterized in that the axial distance between the guide elements or the axial position of the guide element facing the test piece may be adjusted to fit the projecting length.

Abstract: An electrical test device, in particular for testing wafers, having a contact head, which is associated with the test object and is provided with pin-shaped contact elements that are arrayed to form a contact pin arrangement. An electrical connection apparatus, including contact faces which are in touching contact with ends of the contact elements which face away from the test object. A centering device, which permits only radial play for thermal expansion by sliding guides, for centrally aligning the contact head and the connection apparatus with respect to one another.

Abstract: A test device for electrical testing of a unit under test, the device having a contact head which can be associated with the unit under test and is provided with contact elements pins in a contact pin arrangement, having an electrical connecting apparatus, including contact surfaces which make touching contact with first ends of the contact elements which face away from the test plane accommodating the unit under test, and having a supporting apparatus which is arranged on the side of the connecting apparatus facing away from the contact head. Pulling or pushing devices adjust the planar condition or a desired discrepancy from the planar condition of an arrangement of the contact surfaces and those devices are arranged between the supporting apparatus and the connecting apparatus.

Abstract: A test head for making contact with test points of an electric component under test and with contact points on a board, for example. A plurality of spring elastic, elongated electric contact elements have opposite ends which respectively contact a test point at one end and a contact point at the other end. A plurality of at least two and preferably three guide panels are located in the space between the test points and the contact points. A respective, first, second and third opening in the first, second and third panels for each of the contact elements for each of the contact elements, with two adjacent openings for each of the contact elements being laterally offset and misaligned so that the contact element passing through them is held in a friction locked fashion.

Abstract: A test head for making contact with test points arranged close to one another of an electric component. The test head having a plurality of contact elements which can be connected to a connecting element of a test device. The contact elements are in respective feed-through openings through two or three overlying guide panels. The contact elements are axially guidable in the feed-through openings in the panel. Various ways of securing the contact elements against falling out of the test head are provided, including friction locking of the contact elements in one panel, using a securing layer at one panel, laterally offsetting one panel with respect to the others, or by different diameters along the length of the contact element, e.g. by insulation selectively applied along the length. The connecting element and the device for making contact are detachably connected.

Abstract: The spring contact pin contacts electrical or electronic items or devices to be tested for testing purposes. It comprises a sleeve, at least one contact bolt slidable in it and at least two springs which spring load the contact bolt. At least one inner spring is located inside the sleeve guiding the contact bolt slidably. An outer coil spring is positioned on a portion of the shank of the contact bolt extending beyond the sleeve exteriorly so that the spring contact pin can be shortened and the spring travel can be reduced for a given fixed spring force and because of that cost savings may be attained.

Abstract: A resilient contact pin for contacting electrical or electronic items to be tested, such as conductor plates, printed circuit boards or the like, the resilient contact pin being electrically conductive and intended for mounting on a testing arrangement, includes a straight cylindrical member including a metallic tube constituted by a punched and bent sheetmetal part. A contact member includes a piston accommodated in the metallic tube for axial sliding and a frontward end portion projecting out of the metallic tube and serving for contacting the item to be tested. A spring is accommodated in the metallic tube and urged the contact member in a frontward direction relative to the metallic tube. There is further provided at least one lug constituted by an integral region of a circumferential wall of the metallic tube and extending into the interior of the metallic tube to constitute an abutment which limits the extent of the frontward movement of the piston of the contact member.

Abstract: A testing adapter for the contacting of conductor plates for the purpose of their testing includes a plurality of metallic resilient contact pins. Each of these pins includes a cylinder in which a piston of a piston member is received for axial sliding. The piston member extends beyond a cylinder jacket of the cylinder and passes through a bore of a rear guiding plate of the testing adapter. A helical compression spring is arranged on that region of the piston member which extends beyond the cylinder jacket. The piston member is shorter than one-half of the overall length of the resilient contact pin in its relaxes state, and the helical compression spring is at least partially accommodated within the respective bore of the rear guiding plate.

Abstract: A resilient contact pin for contacting electrical or electronic items to be tested, such as conductor plates, printed circuit boards or the like, the resilient contact pin being electrically conductive and intended for mounting on a testing arrangement, includes a straight cylindrical member including a metallic tube constituted by a punched and bent sheet metal part. A contact member includes a piston accommodated in the metallic tube for axial sliding and a frontward end portion projecting out of the metallic tube and serving for contacting the item to be tested. A spring is accommodated in the metallic tube and urges the contact member in a frontward direction relative to the metallic tube. There is further provided at least one lug constituted by an integral region of a circumferential wall of the metallic tube and extending into the interior of the metallic tube to constitute an abutment which limits the extent of the frontward movement of the piston of the contact member.

Abstract: The contactor is used for an electronic tester for testing of electronic items such as printed circuit boards, integrated circuits or the like. It has at least one resilient contact pin which has a piston member and a spring. The piston member and the spring are formed in a single piece from a single piece of metal sheet.