Abstract: An electromagnetic signal analysis apparatus includes a frequency spectrum obtaining unit 11 to obtain a frequency spectrum that is generated based on an electromagnetic signal obtained by a spectral device 20 and represents a property value with respect to a frequency, a water vapor fitting processing unit 12 to fit a waveform of a single fitting function or a composite waveform, of a plurality of fitting functions to a frequency spectrum at a frequency at which absorption of the electromagnetic waves by water vapor is increased, and a property analyzing unit 14 to analyze a property of a liquid sample using at least two values that determine a characteristic of the fitting function used for the fitting, so that the frequency spectrum, at the frequency at which absorption of the electromagnetic waves by water vapor generated from surfaces of the liquid sample is increased is processed to analyze the property of the liquid sample.

Abstract: A terahertz wave is spectrally dispersed into two waves which are caused to pass through a sample liquid film 101 and a reference liquid film 102 and are then collected, and the terahertz waves in an interference state are detected by a terahertz wave detecting semiconductor 15. Consequently, only spectroscopic information related to a distinctive characteristic of the sample liquid film 101 is detected. In addition, a predetermined optical path length difference is provided between a path where the terahertz wave is transmitted through the sample liquid film 101 and a path where the terahertz wave is transmitted through the reference liquid film 102 by an optical delaying unit 17.

Abstract: There are provided a terahertz wave spectral dispersing unit 13 for spectrally dispersing a terahertz wave to be generated from a terahertz wave generating semiconductor 12 into two waves, a terahertz wave focusing unit 14 for focusing a terahertz wave transmitted through a sample liquid film 101 and a terahertz wave transmitted through a reference liquid film 102, and a terahertz wave detecting semiconductor 15 for detecting the focused terahertz wave, and it is possible to detect the terahertz wave transmitted through the sample liquid film 101 and the terahertz wave transmitted through the reference liquid film 102 in an interference state, thereby offsetting a noise made by a stripe-shaped wave generated on the sample liquid film 101 and a noise made by a stripe-shaped wave generated on the reference liquid film 102.