Abstract: Detector device for analyzing ions of high mass using a time-of-flight (TOF) analytical method, consisting of a mass spectrometer 1, accelerating electrodes 2 and a magnetic field and/or electric field, all of which serves to deflect secondary ions 5 emerging from a first conversion dynode 8, so that the secondary ions impinge according to polarity on a second 7 and third 7' conversion dynode.
Type:
Grant
Filed:
May 31, 1991
Date of Patent:
April 13, 1993
Assignee:
Finnigan GmbH
Inventors:
Ulrich-Peter Giessmann, Franz Hillenkamp, Michael Karas