Abstract: An intradermal allergy skin test reading device, comprising a short wave infrared (SWIR) camera including an indium gallium arsenide (InGaAs) SWIR detector, a lens configured to enable the SWIR detector to capture a SWIR image of an allergy skin testing area of a patient; a 1400 nm bandpass filter configured to pass only wavelengths in the 1,350 nm and 1,450 nm range and/or a 1700 nm bandpass filter configured to pass only wavelengths in the 1,600 nm and 1,800 nm range to the SWIR detector, a processing device to analyze the SWIR image detected by the SWIR detector based on the wavelengths passed by the filter and identify a wheal formed on the allergy skin testing area of the patient by differences in spectral reflection from the skin of the wavelengths passed by the filter.

Abstract: Exemplary embodiments are directed to skin test reading devices that include a housing and a short wave infrared (SWIR) detector. The SWIR detector can include a lens configured to enable the SWIR detector to capture an image of a skin testing area of a patient. The SWIR detector can be configured to detect a wheal formed on the skin testing area of the patient. Exemplary embodiments are also directed to methods of reading a skin test and skin test reading systems.

Abstract: Exemplary embodiments are directed to skin test reading devices that include a housing and a short wave infrared (SWIR) detector. The SWIR detector can include a lens configured to enable the SWIR detector to capture an image of a skin testing area of a patient. The SWIR detector can be configured to detect a wheal formed on the skin testing area of the patient. Exemplary embodiments are also directed to methods of reading a skin test and skin test reading systems.