Patents Assigned to FLIR Systems Trading Belgium BVBA
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Patent number: 11774730Abstract: An imaging lens for use with an operational waveband over any subset of 7.5-13.5 ?m may include a first optical element of a first high-index material and a second optical element of a second high-index material, that may have a refractive index greater than 2.2 in the operational waveband, an absorption per mm of less than 75% in the operational waveband, and an absorption per mm of greater than 75% in a visible waveband of 400-650 nm. Optically powered surfaces of the imaging lens may include a sag across their respective clear apertures that are less than 10% of a largest clear aperture of the imaging lens. Respective maximum peak to peak thicknesses of the first and second optical elements may be similar in size, for example within 15 percent of each other. Ratios of maximum peak to peak thickness to clear aperture and, separately, to sag are also provided.Type: GrantFiled: February 8, 2019Date of Patent: October 3, 2023Assignee: FLIR SYSTEMS TRADING BELGIUM BVBAInventor: Jeremy Huddleston
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Patent number: 11682297Abstract: Systems and methods for tracking objects though a traffic control system include an image sensor configured to capture a stream of images of scene from an associated real-world position, an object tracker configured to identify an object in the captured images and define an associated object location in the captured images, a three-dimensional stage model system configured to transform the associated object location in the image to three-dimensional coordinates associated with the image sensor, and a three-dimensional world model configured to transform identified objects to real-world coordinates. Embodiments use lens aberration, sensor mounting height and location, accelerometer, gyro-compass and/or global position satellite information to generate a situational map.Type: GrantFiled: March 26, 2021Date of Patent: June 20, 2023Assignee: FLIR Systems Trading Belgium BVBAInventors: Koen Janssens, Tom Van Severen
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Patent number: 11573305Abstract: Techniques are disclosed for systems and methods to provide accurate and reliable target information when there is relative motion between a remote sensing system and the target. A remote sensing system includes a multichannel ranging sensor assembly and a controller. The ranging sensor assembly includes multiple sensor channels configured to emit modulated sensor beams towards a target and to detect corresponding reflected beams reflected from the target, where the modulated sensor beams are selected to be correlated to each other and mutually incoherent with respect to each other. The controller is configured to receive reflected beam sensor signals corresponding to the detected reflected beams, to determine Doppler components associated with the reflected beams based, at least in part, on the first and second reflected beam sensor signals, and to generate target information based, at least in part, on the determined Doppler components.Type: GrantFiled: November 18, 2019Date of Patent: February 7, 2023Assignee: FLIR Systems Trading Belgium BVBAInventor: Artem Kryvobok
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Patent number: 11138875Abstract: Systems and methods for controlling traffic signaling includes a wireless sensor operable to detect and receive wireless signals emitted from a vehicle, an image sensor operable to capture a stream of images of a field of view. A traffic control system is operable to extract geographic positioning information for the vehicle from the wireless signals, track the vehicle's movement using the extracted geographic positioning information, detect and track an object in the stream of images corresponding to the vehicle. The vehicle's geographic movement is further tracked using a pixel location of the object in steam of images and a traffic control action is executed based on the geographic movement to facilitate passage of the at least one vehicle through a monitored traffic control location.Type: GrantFiled: June 23, 2020Date of Patent: October 5, 2021Assignee: FLIR SYSTEMS TRADING BELGIUM BVBAInventors: Michael Deruytter, Daniel Benhammou
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Patent number: 10803595Abstract: An infrared (IR) imaging module may capture a background image in response to receiving IR radiation from a background of a scene and determine background calibration terms using the background image. The determined background calibration terms may be scale factors and/or offsets that equalize the pixel values of the background image to a baseline, value. IR imaging device may use the background calibration terms to capture images that have the baseline value for pixels corresponding to IR radiation received from the background and higher values (or lower values) for pixels corresponding to IR radiation received from a foreground. Such images may be used to count people and generate a heat map. The background calibration terms may be updated periodically, with the update period being increased at least for some pixels or a pixel area when a person is detected.Type: GrantFiled: June 21, 2018Date of Patent: October 13, 2020Assignee: FLIR Systems Trading Belgium BVBAInventors: Stefan Schulte, Steffen De Muynck
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Patent number: 10591706Abstract: An imaging lens for use with an operational waveband over any subset of 7.5-13.5 ?m may include a first optical element of a first high-index material and a second optical element of a second high-index material. At least two surfaces of the first and second optical elements may be optically powered surfaces. A largest clear aperture of all optically powered surfaces may not exceed a diameter of an image circle of the imaging lens corresponding to a field of view of 55 degrees or greater by more than 30%. The first and second high-index materials may have a refractive index greater than 2.2 in the operational waveband, an absorption per mm of less than 75% in the operational waveband, and an absorption per mm of greater than 75% in a visible waveband of 400-650 nm.Type: GrantFiled: January 12, 2018Date of Patent: March 17, 2020Assignee: FLIR Systems Trading Belgium BVBAInventor: Jeremy Huddleston
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Patent number: 10203483Abstract: An imaging lens for use with an operational waveband over any subset of 7.5-13.5 ?m may include a first optical element of a first high-index material and a second optical element of a second high-index material, that may have a refractive index greater than 2.2 in the operational waveband, an absorption per mm of less than 75% in the operational waveband, and an absorption per mm of greater than 75% in a visible waveband of 400-650 nm. Optically powered surfaces of the imaging lens may include a sag across their respective clear apertures that are less than 10% of a largest clear aperture of the imaging lens. Respective maximum peak to peak thicknesses of the first and second optical elements may be similar in size, for example within 15 percent of each other. Ratios of maximum peak to peak thickness to clear aperture and, separately, to sag are also provided.Type: GrantFiled: June 1, 2016Date of Patent: February 12, 2019Assignee: FLIR SYSTEMS TRADING BELGIUM BVBAInventor: Jeremy Huddleston
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Patent number: 10147750Abstract: The present invention provides optical imaging apparatus comprising solid state sensing elements and optical components operable to be manufactured and assembled at the wafer level.Type: GrantFiled: February 3, 2010Date of Patent: December 4, 2018Assignee: FLIR Systems Trading Belgium BVBAInventors: Moshe Kriman, William Hudson Welch, Giles Humpston, Osher Avsian, Felix Hazanovich, Ekaterina Axelrod
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Patent number: 10054718Abstract: Systems, methods, and computer-readable media are provided for machining a feature on a work piece along a curving tool path including a spiral pattern with continuously varying radius. In particular, the feature is scribed by a tool while varying an angle of rotation of a cutting surface of the tool with respect to the work piece to maintain a substantially constant angle between the cutting surface and a corresponding relative translational movement between the cutting surface and the work piece along the spiral pattern. A dynamic feed rate of the tool also is varied continuously with respect to the work piece based on the continuously varying radius of the at least one spiral pattern to substantially maintain a target centripetal acceleration of the tool with respect to the work piece.Type: GrantFiled: October 30, 2015Date of Patent: August 21, 2018Assignee: FLIR Systems Trading Belgium BVBAInventors: David Keller, Brett Brocato
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Patent number: 9910239Abstract: In one aspect, the present invention provides a wafer level optical assembly comprising a first wafer level optical element, the first wafer level optical element comprising a first alignment structure and a second wafer level optical element, the second wafer level optical element comprising a second alignment structure, wherein the first alignment structure contacts the second alignment structure.Type: GrantFiled: November 30, 2010Date of Patent: March 6, 2018Assignee: FLIR Systems Trading Belgium BVBAInventors: David Ovrutsky, William Hudson Welch, Roman C. Gutierrez, Robert J. Calvet
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Patent number: 9891414Abstract: An imaging lens for use with an operational waveband over any subset of 7.5-13.5 ?m may include a first optical element of a first high-index material and a second optical element of a second high-index material. At least two surfaces of the first and second optical elements may be optically powered surfaces. A largest clear aperture of all optically powered surfaces may not exceed a diameter of an image circle of the imaging lens corresponding to a field of view of 55 degrees or greater by more than 30%. The first and second high-index materials may have a refractive index greater than 2.2 in the operational waveband, an absorption per mm of less than 75% in the operational waveband, and an absorption per mm of greater than 75% in a visible waveband of 400-650 nm.Type: GrantFiled: May 23, 2016Date of Patent: February 13, 2018Assignee: FLIR SYSTEMS TRADING BELGIUM BVBAInventor: Jeremy Huddleston
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Patent number: 9348120Abstract: An imaging lens for use with an operational waveband over any subset of 7.5-13.5 ?m may include a first optical element of a first high-index material and a second optical element of a second high-index material. At least two surfaces of the first and second optical elements may be optically powered surfaces. A largest clear aperture of all optically powered surfaces may not exceed a diameter of an image circle of the imaging lens corresponding to a field of view of 55 degrees or greater by more than 30%. The first and second high-index materials may have a refractive index greater than 2.2 in the operational waveband, an absorption per mm of less than 75% in the operational waveband, and an absorption per mm of greater than 75% in a visible waveband of 400-650 nm.Type: GrantFiled: January 23, 2012Date of Patent: May 24, 2016Assignee: FLIR SYSTEMS TRADING BELGIUM BVBAInventor: Jeremy Huddleston
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Patent number: 9207662Abstract: Embodiments of systems, methods, and computer-readable media for machining materials are disclosed. For example, one embodiment of the present invention includes a method for machining a feature on a work piece (100) along a curving tool path having the steps of controlling a relative translational movement between a tool table and the work piece (100) along the curving tool path and controlling a corresponding angle of rotation of the tool table with respect to the work piece (100) to maintain a substantially constant angle between the tool table and the corresponding relative translational movement between the tool table and the work piece (100) along the curving tool path. In another embodiment, a computer-readable media includes code for a carrying out such a method.Type: GrantFiled: September 18, 2009Date of Patent: December 8, 2015Assignee: FLIR Systems Trading Belgium BVBAInventors: David Keller, Brett Brocato
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Patent number: 8953087Abstract: A camera system may include an optics stack including two substrates, the optics stack forming an imaging system, each substrate having two surfaces that are parallel to each other and perpendicular to an optical axis of the imaging system, the optics stack including a securing region on opposing surfaces of the two substrates, the two substrates being secured together on a wafer level at their respective securing regions, at least one of the surfaces of the two substrates including a refractive surface of the imaging system, a detector substrate having an active area and a cover structure protecting at least the active area of the detector substrate, the optics stack being secured to an upper surface of the cover structure.Type: GrantFiled: August 10, 2010Date of Patent: February 10, 2015Assignee: FLIR Systems Trading Belgium BVBAInventors: Michael R. Feldman, James E. Morris, Robert D. TeKolste
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Patent number: 8891179Abstract: The present invention, in some embodiments, provides a low distortion singlet lens and optical imaging apparatus including the same.Type: GrantFiled: June 11, 2010Date of Patent: November 18, 2014Assignee: FLIR Systems Trading Belgium BVBAInventors: Jeremy Huddleston, Donald Rosenberry
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Patent number: 8885257Abstract: Optical imaging apparatuses are provided having desired focal properties. An optical imaging apparatus can include at least one wafer level optical element, a spacer, a second wafer comprising a focus compensation standoff, and an electro-optical element. For some apparatuses, the focus compensation standoff may include an electro-optical element mounting surface having a roughness different from at least one other surface of the focus compensation standoff. Also described are methods of producing a plurality of optical imaging apparatuses. Some methods include providing an optical wafer having a first and second optical element, determining a first and second focal point of a first and second optical die; providing a second wafer having a first and second focus compensation standoff; and adjusting the heights of the first and second focus compensation standoffs to position a first and second electro-optical element at or near a first and second focal point, respectively.Type: GrantFiled: October 20, 2010Date of Patent: November 11, 2014Assignee: FLIR Systems Trading Belgium BVBAInventors: David Ovrutsky, Hagit Gershtenman-Avsian, Alan Kathman, Jennifer Plyler
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Patent number: 8848301Abstract: Optical imaging apparatus are provided having the desired focal properties, which can be manufactured and/or assembled at the wafer level.Type: GrantFiled: February 3, 2010Date of Patent: September 30, 2014Assignee: FLIR Systems Trading Belgium BVBAInventors: William Hudson Welch, David Ovrutsky, Andrew Aranda
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Patent number: D885456Type: GrantFiled: June 7, 2018Date of Patent: May 26, 2020Assignee: FLIR Systems Trading Belgium BVBAInventors: Jonas Tiersen, Joachim Naessens, Pieter Van de Velde, Arnaud Cuylen, Jan Thierens
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Patent number: D940778Type: GrantFiled: December 31, 2018Date of Patent: January 11, 2022Assignee: FLIR Systems Trading Belgium BVBAInventors: Jonas Tiersen, Nick Logghe