Abstract: Provided is an optical imaging system, adapted for presenting an image of a particle. The optical imaging system includes a collimated light source, a flow channel, and a telecentric lens. The collimated light source is adapted for emitting a parallel beam. The flow channel is arranged on the transmission path of the parallel beam and is adapted for allowing the particle to pass through. The telecentric lens is arranged on the transmission path of the parallel beam. The parallel beam passes through the flow channel before transmitted to the telecentric lens, and the telecentric lens is adapted for converging the parallel beam onto an imaging plane.

Abstract: The image analysis method of the disclosure includes following steps: obtaining an image of a multi-layer structure provided by an electron microscope and displaying the image of the multi-layer structure through a display device, wherein the image of the multi-layer structure is a gray-scale image; setting a measurement line segment on the image of the multi-layer structure, wherein the measurement line segment extends along a first direction; detecting a gray-scale distribution within the measurement line segment corresponding to the image of the multi-layer structure along the measurement line segment; and analyzing the gray-scale distribution to determine a plurality of dark layer thicknesses and a plurality of light layer thicknesses according to a threshold range.

Abstract: An observation carrier includes a bottom base, a lower cover, an upper cover, and a rotation cover. The bottom has at least one first positioning portion. The lower cover has at least one second positioning portion, and at least one third positioning portion. The lower cover is detachably disposed on the bottom base and positioned with the first positioning portion through the second positioning portion. The upper cover has at least one fourth positioning portion and is detachably disposed on the bottom base. The upper cover is positioned with the third positioning portion through the fourth positioning portion. An observation region is formed between the upper cover and the lower cover. The rotation cover is detachably disposed on the bottom base to limit the upper and lower covers on the bottom base. The rotation cover is adapted to rotate to be locked or released by the bottom base.

Abstract: An observation carrier for a microscope is provided. The observation carrier includes a rotation base and a driving unit. The rotation base is adapted to carry a base material, the base material is adapted to receive a droplet, and the droplet includes a sample liquid and at least one sample particle suspended in the sample liquid. The driving unit is connected to the rotation base and is adapted to drive the rotation base to rotate, such that the sample liquid on the base material is removed by a centrifugal force produced by the rotation of the rotation base. In addition, a using method of the observation carrier for a microscope is also provided.

Abstract: A coin battery testing device, including a bottom base, an upper cover, a positive conducting structure, and a negative conducting structure, is provided. The bottom base has an observation region and is adapted to carry a coin battery by the observation region. The upper cover is detachably connected to the bottom base and adapted to cover the coin battery on the observation region. The upper cover has an opening and the opening corresponds to the observation region, such that the coin battery is adapted to be observed through the opening. The positive conducting structure is disposed on the bottom base and adapted to be connected to a positive electrode of the coin battery on the observation region. The negative conducting structure is disposed on the bottom base and adapted to be connected to a negative electrode of the coin battery on the observation region.

Abstract: An observation carrier for a microscope is provided. The observation carrier includes a bottom base, an upper cover, and a chip. The upper cover is detachably disposed on the bottom base and has a window. The chip is integrated on the upper cover and includes a main body and a plurality of electrodes. The main body has an observation region, and the observation region corresponds to the window and is adapted to carry a sample material. The electrodes are disposed on the main body and are connected to the observation region.

Abstract: A microscope adapted to observe a sample is provided. The microscope includes a carrier, and the carrier includes a bottom base, an upper cover and a protruding structure. The upper cover is disposed on the bottom base and has an observing region, and the sample is adapted to be observed in the observing region. A first flow passage is formed between the bottom base and the upper cover, the observing region is located in the first flow passage, and a first fluid is adapted to flow through the observing region along the first flow passage. The protruding structure is connected to the bottom base or the upper cover and located in the first flow passage, and the protruding structure surrounds the observing region.

Abstract: A microscope adapted to observe a sample is provided. The microscope includes a carrier, and the carrier includes a bottom base, an upper cover and a protruding structure. The upper cover is disposed on the bottom base and has an observing region, and the sample is adapted to be observed in the observing region. A first flow passage is formed between the bottom base and the upper cover, the observing region is located in the first flow passage, and a first fluid is adapted to flow through the observing region along the first flow passage. The protruding structure is connected to the bottom base or the upper cover and located in the first flow passage, and the protruding structure surrounds the observing region.