Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(?), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(?) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm?1. According to the method of the invention, partial correction functions Fi(?) are generated by forming the quotient of the measured fluorescence spectra Ji(?) and the corresponding corrected fluorescence spectra Ii(?), which are then combined to form a total correction function F(?) for a broad spectral range.
Inventors:
Ute Resch-Genger, Dietmar Pfeifer, Christian Monte, Angelika Hoffmann, Pierre Nording, Bernhard Schönenberger, Katrin Hoffmann, Monika Spieles, Knut Rurack
Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(?), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(?) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm?1. According to the method of the invention, partial correction functions Fi(?) are generated by forming the quotient of the measured fluorescence spectra Ji(?) and the corresponding corrected fluorescence spectra Ii(?), which are then combined to form a total correction function F(?) for a broad spectral range.
Type:
Grant
Filed:
September 9, 2005
Date of Patent:
May 11, 2010
Assignees:
BAM Bundesanstalf fur Materialforschung und - prufung, Fluka GmbH
Inventors:
Ute Resch-Genger, Dietmar Pfeifer, Christian Monte, Angelika Hoffmann, Pierre Nording, Bernhard Schönenberger, Katrin Hoffmann, Monika Spieles, Knut Rurack
Abstract: The invention relates to a calibration system (10) for characterizing luminescence measurement systems, in particular spectrally resolving, wide-field and/or confocal imaging systems, with (a) a baseplate (12) with at least one flow-through channel (18), wherein the at least one channel (18) is formed as a sample chamber for the luminescence measurement system, (b) at least one reservoir (20) in communication with the at least one channel (18) and adapted to receive a liquid, and (c) at least one focusing device (24) integrated into a baseplate (12) for setting a defined measurement beam focus of the luminescence measurement system to be calibrated by using a focusing surface (26).
Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(?), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(?) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm?1. According to the method of the invention, partial correction functions Fi(?) are generated by forming the quotient of the measured fluorescence spectra Ji(?) and the corresponding corrected fluorescence spectra Ii(?), which are then combined to form a total correction function F(?) for a broad spectral range.
Type:
Application
Filed:
September 9, 2005
Publication date:
September 28, 2006
Applicants:
BAM Bundesanstalt Fuer Materialforschung und - pruefung, Fluka GmbH
Inventors:
Ute Resch-Genger, Dietmar Pfeifer, Christian Monte, Angelika Hoffmann, Pierre Nording, Bernhard Schoenenberger, Katrin Hoffmann, Monika Spieles, Knut Rurack