Patents Assigned to Focus e-Beam Technology (Beijing) Co., Ltd.
  • Patent number: 9797813
    Abstract: Provided is a microtomic system and process for the preparation of sections for microscope examination. A cutting edge in the system can cut through a sample block and produce a section one end of which remains attached to the cutting edge. A voltage generator can generate a voltage and apply the voltage between the cutting edge and a section receiver such as a semiconductor chip grid. Through electrostatic force caused by the voltage, another end of the section can anchor to the section receiver. The section is then spread on the receiver. The system is automatable, highly efficient, and does not need liquid to float sample sections, and can therefore maintain the integration of the sample sections.
    Type: Grant
    Filed: July 13, 2016
    Date of Patent: October 24, 2017
    Assignee: Focus e-Beam Technology (Beijing) Co., Ltd.
    Inventor: Zhongwei Chen
  • Patent number: 9719889
    Abstract: Provided is a process of using a microtomic system for the preparation of sections for microscope examination. A cutting edge in the system can cut through a sample block and produce a section one end of which remains attached to the cutting edge. A voltage generator can generate a voltage and apply the voltage between the cutting edge and a section receiver such as a semiconductor chip grid. Through electrostatic force caused by the voltage, another end of the section can anchor to the section receiver. The section is then spread on the receiver. The system is automatable, highly efficient, and does not need liquid to float sample sections, and can therefore maintain the integration of the sample sections.
    Type: Grant
    Filed: July 13, 2016
    Date of Patent: August 1, 2017
    Assignee: Focus e-Beam Technology (Beijing) Co., Ltd.
    Inventor: Zhongwei Chen
  • Publication number: 20160320270
    Abstract: Provided is a process of using a microtomic system for the preparation of sections for microscope examination. A cutting edge in the system can cut through a sample block and produce a section one end of which remains attached to the cutting edge. A voltage generator can generate a voltage and apply the voltage between the cutting edge and a section receiver such as a semiconductor chip grid. Through electrostatic force caused by the voltage, another end of the section can anchor to the section receiver. The section is then spread on the receiver. The system is automatable, highly efficient, and does not need liquid to float sample sections, and can therefore maintain the integration of the sample sections.
    Type: Application
    Filed: July 13, 2016
    Publication date: November 3, 2016
    Applicant: Focus e-Beam Technology (Beijing) Co., Ltd.
    Inventor: Zhongwei Chen
  • Publication number: 20160313219
    Abstract: Provided is a microtomic system and process for the preparation of sections for microscope examination. A cutting edge in the system can cut through a sample block and produce a section one end of which remains attached to the cutting edge. A voltage generator can generate a voltage and apply the voltage between the cutting edge and a section receiver such as a semiconductor chip grid. Through electrostatic force caused by the voltage, another end of the section can anchor to the section receiver. The section is then spread on the receiver. The system is automatable, highly efficient, and does not need liquid to float sample sections, and can therefore maintain the integration of the sample sections.
    Type: Application
    Filed: July 13, 2016
    Publication date: October 27, 2016
    Applicant: Focus e-Beam Technology (Beijing) Co., Ltd.
    Inventor: Zhongwei Chen
  • Patent number: 9464967
    Abstract: Provided is a microtomic system and process for the preparation of sections for microscope examination. A cutting edge in the system can cut through a sample block and produce a section one end of which remains attached to the cutting edge. A voltage generator can generate a voltage and apply the voltage between the cutting edge and a section receiver such as a semiconductor chip grid. Through electrostatic force caused by the voltage, another end of the section can anchor to the section receiver. The section is then spread on the receiver. The system is automatable, highly efficient, and does not need liquid to float sample sections, and can therefore maintain the integration of the sample sections.
    Type: Grant
    Filed: May 21, 2014
    Date of Patent: October 11, 2016
    Assignee: Focus e-Beam Technology (Beijing) Co., Ltd.
    Inventor: Zhongwei Chen