Abstract: The present invention relates to a low-loss microwave device test fixture which presents as little losses as possible along the signal path and which can permit impedance transformations. The test fixture includes a frame having two opposite extremities, a top, a bottom, a height and a width. The device is further provided with a device supporting column located between the two extremities, having a top surface lying below the top of the frame adapted to receive the device. Two adjustable blocks are further provided, each located between the device supporting column and an opposite extremity, each of the blocks being vertically adjustable. Between the adjustable blocks and the top of the device are two brackets, each for receiving a flange of a device, each of the brackets being secured to an opposite extremity of the frame. The device can be secured to the column and the column and the blocks can be vertically adjusted.

Abstract: The present invention discloses a harmonic rejection load pull tuner. The tuner of the invention has a large-band tuner having an input and an output, and a transmission line having a longitudinal axis. The transmission line has an input connected to the output of a DUT and an output connected to the input of the large-band tuner. In parallel with the transmission line is at least one stub, the at least one stub having a length adapted to reflect out an nth order harmonic of a base frequency, where n is an integer greater than 1. The tuner of the present invention can be used to perform input or output characterisation (or both) of a DUT, by selectively reflecting out at least one harmonic frequency of the base frequency. Consequently, the characterisation of the DUT is improved, since the effects of the harmonics are considerably reduced. The present invention also concerns a method for performing input or output characterisation.