Abstract: Provided is a system for testing a material, including a testing device configured to apply a physical test to a material and including sensors configured to measure parameters of the material, at least one processor in communication with the testing device programmed or configured to: select a test specimen, automatically set-up the testing device for at least one test, generate test data based at least partially on the parameters measured by the sensors, and communicate the test data to a remote system, at least one server computer remote from the testing device and the at least one processor, the at least one server computer programmed or configured to: send specimen and test parameter data, receive the test data and store the test data in a database in association with at least one identifier that uniquely identifies the testing device, and prevent modification of the test data stored in the database.
Type:
Grant
Filed:
October 5, 2018
Date of Patent:
July 13, 2021
Assignee:
Forney, L.P.
Inventors:
Scott M. Grumski, Mark Stafura, Matthew Henry, Jeffrey P. Dziki