Abstract: An A/D converter system that has a ranging detector that receives and characterizes an input signal. The characterizing sets a coarse range selection based on a level of the input signal. A higher level input signal has a higher level ranging. An A/D converter includes a compression system that compresses based on the ranging output signal by converting different numbers of bits for different level ranging output signal. A higher level input signal is more higher compressed and produces a digital output indicative of the input signal, which is compressed by different amounts based on the ranging output signal. By scaling in this way, the resolution of the A/D converter is scaled on the basis of shot noise level of the image sensor.

Abstract: A switched capacitor sample and hold buffer that can be used, for example, in a CMOS image sensor. The switched capacitor sample and hold circuit has large output swings, low noise and reduced capacitor area compared to the traditional switched capacitor approach.

Abstract: A chip device with a number of individually powered parts, such as photoreceptors. A mesh is provided to provide power to the individual photoreceptors. The mesh may be provided for ground and power and/or both. The mesh may be on different layers, so that one portion of the mesh is exactly over the other portion of the mesh. The mesh takes up a portion of real estate on the chip in between the individual photoreceptors, in locations where image sensing parts cannot be located. In an embodiment, the mesh can be intentionally broken at various locations to optimize the path length.

Abstract: A chip device with a number of individually powered parts, such as photoreceptors. A mesh is provided to provide power to the individual photoreceptors. The mesh may be provided for ground and power and/or both. The mesh may be on different layers, so that one portion of the mesh is exactly over the other portion of the mesh. The mesh takes up a portion of real estate on the chip in between the individual photoreceptors, in locations where image sensing parts cannot be located. In an embodiment, the mesh can be intentionally broken at various locations to optimize the path length.

Abstract: A column parallel image sensor such as an active pixel sensor includes a calibration circuit for the readout circuit within the active pixel sensor. The calibration circuit produces a value that is stored and used to offset any noise in the A/D converter. The calibration is carried out each time that each row is read out so in effect the calibration's individual for each pixel. Hence, any noise within the calibration evens out within the image, and is effectively random within the image and hence becomes less noticeable within the image.

Abstract: An image sensor with an electronic neutral density filter. Each pixel of the image sensor is capable of being electronically adjusted such that the total charge integration is effectively changed by an amount of the adjustment. The adjustment uses a variable capacitor, here are paper wrapped are formed by an MOS transistor. The capacitor may be within each pixel, or may be shared between multiple pixels.