Patents Assigned to FUJIAN METROLOGY INSTITUTE
  • Patent number: 9116033
    Abstract: A verification system for a large-scale weighing machine comprises at least four tension frameworks penetrating through a weighing platform hole preset on a weighing platform surface of the weighing machine, for connecting to a weighing platform foundation and being disposed perpendicular to the weighing platform surface, at least four self-adjusting loading-unloading load measuring devices disposed corresponding to the tension frameworks, and a constant-load control device connected with the loading-unloading mechanism and allows the loading-unloading mechanism to maintain constant applied load while loading. The self-adjusting loading-unloading load measuring devices includes a self-adjusting loading-unloading mechanism and a high-precision load measuring instrument adjacent to the top side of the loading-unloading mechanism. The high-precision load measuring instrument is at least three times larger than an accuracy of the weighing machine.
    Type: Grant
    Filed: May 30, 2011
    Date of Patent: August 25, 2015
    Assignee: FUJIAN METROLOGY INSTITUTE
    Inventors: Jianhui Lin, Jiankang Song, Jinhui Yao, Hui Chi
  • Patent number: 9097574
    Abstract: A method for calibrating large fixed electronic scale is provided. The method applies an auxiliary verification device to calibrate the large fixed electronic scale without using a weight and includes following steps of: loading and unloading every supporting point on the scale table board of the scale by at least one self-locating loading and unloading mechanism; measuring and displaying a load that each loading and unloading mechanisms applies to the scale table board by at least one high accuracy load gauge; controlling a size of the load that each loading and unloading mechanisms applies to the scale table board by a constant load control device; and comparing a precise load displayed by the high accuracy load gauge with a gauge weighing display value of the scale to obtain a calibration error of the scale. The present method greatly improves working efficiency and safety and reduces costs.
    Type: Grant
    Filed: May 30, 2011
    Date of Patent: August 4, 2015
    Assignee: FUJIAN METROLOGY INSTITUTE
    Inventors: Jinhui Yao, Qin Lin, Jianhui Lin, Hui Chi
  • Publication number: 20130098136
    Abstract: A method for calibrating large fixed electronic scale is provided. The method applies an auxiliary verification device to calibrate the large fixed electronic scale without using a weight and includes following steps of: loading and unloading every supporting point on the scale table board of the scale by at least one self-locating loading and unloading mechanism; measuring and displaying a load that each loading and unloading mechanisms applies to the scale table board by at least one high accuracy load gauge; controlling a size of the load that each loading and unloading mechanisms applies to the scale table board by a constant load control device; and comparing a precise load displayed by the high accuracy load gauge with a gauge weighing display value of the scale to obtain a calibration error of the scale. The present method greatly improves working efficiency and safety and reduces costs.
    Type: Application
    Filed: May 30, 2011
    Publication date: April 25, 2013
    Applicant: FUJIAN METROLOGY INSTITUTE
    Inventors: Jinhui Yao, Qin Lin, Jianhui Lin, Hui Chi