Patents Assigned to Fuji Facom Corporation
  • Patent number: 5647019
    Abstract: The present invention relates to a method of identifying object images displayed in a camera image, the method comprising the step of, comparing a predetermined point mapped in the camera image in a spherical polar coordinates with a position of the camera as an origin, with a plurality of cursor windows including the object images respectively in the camera image, in which vertexes and center point of each window are mapped in the camera image in a spherical polar coordinates with a position of the camera as an origin, so that an object included in a cursor window corresponding to the predetermined point is identified.
    Type: Grant
    Filed: May 28, 1993
    Date of Patent: July 8, 1997
    Assignees: Fuji Electric Co., Ltd., Fuji Facom Corporation
    Inventors: Mitsutoshi Iino, Shiro Nakatao
  • Patent number: 5485531
    Abstract: A feature recognition method and apparatus is described where in one embodiment the digitized two-dimensional pattern or image usually of a character to be recognized is subjected first to conversion into a vector. The vector subsequently undergoes propagation and stopping operations subject to various tests so as to generate a list of unique features about the pattern being identified. Thusly, identified features are compared mathematically to a previously created feature library until a match is found. In an alternative embodiment, to increase the speed of three-dimensional, feature-extraction processing of character patterns the vector-extraction positions on a pattern are converted into flags and accommodated in a corresponding motion-flag memory.
    Type: Grant
    Filed: September 17, 1993
    Date of Patent: January 16, 1996
    Assignees: Fuji Electric Co., Ltd., Fuji Facom Corporation
    Inventors: Hitoshi Ichinohe, Yasuo Hongo, Masatoshi Okada
  • Patent number: 5479567
    Abstract: A fuzzy feedback controller is designed as follows: A deviation between a process value and a set value, and a variation of the deviation are obtained with the aid of an arithmetic memory device, and the deviation and the variation of the deviation are normalized with normalizing devices. A fuzzy inference operating device performs a fuzzy inference by using the deviation and the variation of the deviation thus normalized, to obtain a control output variation. The control output variation is normalized with another normalizing device. The control output variation .DELTA.u thus normalized is added to the preceding control output in an addition device, to form a new control output, which is applied to an operating device. A parameter adapting device makes normalizing parameters adaptive according to the response waveform of the process value.
    Type: Grant
    Filed: February 23, 1994
    Date of Patent: December 26, 1995
    Assignees: Fuji Electric Co., Ltd., Fuji Facom Corporation
    Inventors: Kazutaka Shinmura, Masakazu Ikoma
  • Patent number: 4745540
    Abstract: A process input/output system for a sequence controller includes integrally an input portion having a data reading portion for reading an external input signal from an external unit, an input control portion for judging an input condition of the external input signal from the read signal, and a first data memory for storing an input condition determined by the input control portion an output portion having a second data memory for storing output data inputted from a bus of the sequence controller to an external unit, and an output control portion for outputting the stored data to the external unit and holding the stored output data; a preset portion for presetting the selection of whether the unit is to be used as an input unit or as an output unit, the selection of the number of input terminals and output terminals and input response time; and a bus controlling portion for controlling the bus to perform exchanges of data between the first and second data memories and the bus, respectively.
    Type: Grant
    Filed: November 13, 1985
    Date of Patent: May 17, 1988
    Assignees: Fuji Electric Company Ltd., Fuji Facom Corporation
    Inventors: Akihide Hamada, Keiichi Tomizawa
  • Patent number: 4725148
    Abstract: In a turbidimeter for measuring a turbidity of a test solution to be measured i.e. culture solution in a fermentation apparatus, a semiconductor laser diode and a semiconductor photodiode are integrally arranged in a detection portion of the turbidimeter in such a manner that a laser beam emitted from the semiconductor laser diode is made incident upon the semiconductor photodiode through the test solution. Moreover, a protection circuit for the semiconductor laser diode and the semiconductor photodiode is also arranged in the turbidimeter to cut off a current flowed therethrough when an environmental temperature becomes above a predetermined temperature. Therefore, the turbidimeter can be made small in size and light in weight, and the turbidity can be measured accurately over wide range.
    Type: Grant
    Filed: May 30, 1985
    Date of Patent: February 16, 1988
    Assignees: Komatsugawa Chemical Engineering Co., Ltd., Rikagaku Kenkyusho, Fuji Facom Corporation
    Inventors: Isao Endo, Teruyuki Nagamune, Ichiro Inoue, Kozo Inoue, Tadashi Nohira, Ikuzo Kagami, Tatsuya Iwakura
  • Patent number: 4695729
    Abstract: A tubular part wall thickness measuring device includes a radiation source having a plurality of radiation sources disposed in a line. The radiation passes through a collimator to provide parallel radiation beams which pass transversely through a tubular part to a radiation detector. The length of the radiation source and the radiation detector are greater than the diameter of the tubular part to be measured so that the radiation passes through an entire section of the tubular part so that the average wall thickness of the tubular part can be determined from the amount of attenuation of radiation which is detected by the detector.
    Type: Grant
    Filed: May 27, 1986
    Date of Patent: September 22, 1987
    Assignees: Fuji Electric Co., Ltd., Fuji Facom Corporation and Kawasaki Steel Corporation
    Inventors: Asao Monno, Kiyoo Watanabe, Kazuyuki Kaneko
  • Patent number: 4500953
    Abstract: A data processing system including a data transfer abnormality processing unit in which delays caused by the production of a data transfer abnormality signal during a data transfer cycle period are eliminated. A bus controller, a memory unit and one more data processing units are connected in parallel to a common bus which includes a data transfer abnormality signal line. The bus controller includes a data register which receives data from the common bus, delaying it for one cycle period before applying it to a transfer abnormality check circuit. The transfer abnormality signal produced by the transfer abnormality check circuit is stored in a transfer abnormality setting flip-flop in each data processing circuit with a clock pulse which is produced delayed with respect to a bus use permission signal.
    Type: Grant
    Filed: June 23, 1981
    Date of Patent: February 19, 1985
    Assignees: Fuji Facom Corporation, Fuji Electric Company Limited
    Inventors: Fumihiko Takezoe, Junichi Fujii