Patents Assigned to Furukawa America, Inc.
  • Publication number: 20060028712
    Abstract: A system, method and computer program product for determining excited state absorption (ESA) dependent parameters (gain and noise figure) of an EDF and an EDFA corresponding to a determined average inversion value of an EDF. Also, a system, method and computer program product for using an EDFA model that incorporates ESA parameters to in calculating an EDFA gain and noise figure to design laser systems with high accuracy.
    Type: Application
    Filed: May 9, 2005
    Publication date: February 9, 2006
    Applicants: FURUKAWA AMERICA, INC, OFS FITEL, LLC
    Inventors: Tomoko Ohtsuki, Jutarou Miura, Masaru Fukushima, Baishi Wang
  • Patent number: 6900510
    Abstract: A Microelectromechanical (MEMS) device and method of fabrication that can minimize derailing of an actuable element of the MEMS device during fabrication can include a MEMS actuator to selectively generate displacement forces to displace an actuable element along a path between sidewalls of a channel. The sidewalls can have stops formed therein that can interact with surfaces on the actuable element to limit displacement of the actuable element during fabrication. One of the sidewalls can be indented to form the stops and the actuable element can have an arm portion that extends between the stops. The sidewalls can be offset to form the stops on spaced apart faces on opposite sides of the channel and the actuable element can be offset between the spaced apart faces to form offset faces in an opposing relationship with the spaced apart faces on the sidewalls. In addition, the actuable element and the sidewalls may be so shaped as to maintain a generally constant width between them.
    Type: Grant
    Filed: December 4, 2002
    Date of Patent: May 31, 2005
    Assignees: Advanced Microsensors, Furukawa America, Inc.
    Inventors: Hirokazu Tamura, Matthew J. Neal, Alan L. Sidman, Jiang Zhe
  • Patent number: 6812055
    Abstract: Microelectromechanical (MEMS) devices that use MEMS electromagnetic actuators to selectively generate displacement forces are disclosed herein. According to one exemplary embodiment disclosed herein, a MEMS device may include a substrate having a surface, an actuable element at least partially formed from the substrate, and an electromagnetic actuator disposed on the substrate for selectively applying a first force to the actuable element to displace the actuable element along a path. The actuable element may have a base and an arm coupled to the base. The base may include a portion comprised of a magnetic material. The electromagnetic actuator may comprise an electrically conductive coil, and the path of the actuable element may pass through a coil gap in the coil. The electromagnetic actuator may also comprise a magnetic core about which the electrically conductive coil may be wound.
    Type: Grant
    Filed: December 18, 2003
    Date of Patent: November 2, 2004
    Assignees: Advanced Microsensors, Furukawa America, Inc.
    Inventors: Hirokazu Tamura, Matthew J. Neal, Akira Mugino, Alan L. Sidman
  • Patent number: 6717227
    Abstract: Microelectromechanical (MEMS) devices that use MEMS electromagnetic actuators to selectively generate displacement forces are disclosed herein. According to one exemplary embodiment disclosed herein, a MEMS device may include a substrate having a surface, an actuable element at least partially formed from the substrate, and an electromagnetic actuator disposed on the substrate for selectively applying a first force to the actuable element to displace the actuable element along a path. The actuable element may have a base and an arm coupled to the base. The base may include a portion comprised of a magnetic material. The electromagnetic actuator may comprise an electrically conductive coil, and the path of the actuable element may pass through a coil gap in the coil. The electromagnetic actuator may also comprise a magnetic core about which the electrically conductive coil may be wound.
    Type: Grant
    Filed: February 21, 2002
    Date of Patent: April 6, 2004
    Assignees: Advanced Microsensors, Furukawa America, Inc.
    Inventors: Hirokazu Tamura, Matthew J. Neal, Akira Mugino, Alan L. Sidman