Abstract: An inspection system is disclosed. The inspection system includes an image capturing system oriented to capture at least one component image of a component from at least one viewing angle, the at least one component image including a set of features selected to enable features of the components and features of defects on surfaces of the component to be identified, and a processor. The processor is configured to classify a type of defect detected on surfaces of the component in the at least one component image and assign zones to surfaces of the component captured in the at least one component image.