Patents Assigned to GE Inspection Technologies
  • Patent number: 11639872
    Abstract: Systems, methods, and computer readable medium are provided for determining interferometric data and spectral data associated with combustion conditions of a flame in a combustion chamber using a sensor head including a first vacuum cavity, a diaphragm operatively interfaced to an inner portion of the combustion chamber, and an optical sensor interrogator configured on a computing device and coupled to the sensor head via optical fibers. The optical sensor interrogator including an interferometer configured to determine interferometric data associated with the flame based on light transmitted and reflected via a first optical fiber and a spectrometer configured to determine spectral data associated with the flame based on light transmitted via a second optical fiber.
    Type: Grant
    Filed: April 3, 2020
    Date of Patent: May 2, 2023
    Assignee: GE Inspection Technologies, LP
    Inventor: Michael Charles Spalding
  • Patent number: 10817152
    Abstract: A method can include receiving data identifying an industrial asset. The method can also include receiving data characterizing one or more sensors configured to detect a first property of the asset. The method can further include determining a first graphical representation of the asset based on the received data identifying the industrial asset, and a second graphical representation of a first sensor of the one or more sensors based on the received data characterizing one or more properties of one or more sensors. The method can further include rendering, in a graphical display space, the first graphical representation and the second graphical representation. One or more visual properties of the second graphical representation can be indicative of one or more properties of the first sensor and/or the detected first property of the asset.
    Type: Grant
    Filed: September 11, 2018
    Date of Patent: October 27, 2020
    Assignee: GE Inspection Technologies, LP
    Inventors: Bobby Dale Hournbuckle, Jr., Matthew Harvey Krohn, Mark Rosenberg, Tara Merry, Naren Pradyumna Dasu, Mary Campos, Williams Garcia, Grigory Nudelman
  • Patent number: 10539515
    Abstract: Method and apparatus are provided for calibration or verification of accuracy specification of a computed tomographic system. In one embodiment, the apparatus can include a base structure, a first set of test objects arranged along a first axis and coupled to the base structure, and a second set of test objects arranged along a second axis and coupled to the base structure. The first set of test objects and the second set of test objects have a first geometry. The apparatus can also include a third set of test objects and a fourth set of test objects. The third set of test objects, and the fourth set of test objects have a second geometry different from the first geometry. Locations of the first, second third and fourth set of test objects are spatially fixed with respect to the base structure. The apparatus is a test specimen adapted for calibration or accuracy verification of computed tomography system.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: January 21, 2020
    Assignee: GE Inspection Technologies, LP
    Inventors: Andreas Fischer, Nils Rothe, Alexander Suppes, Eugen Trapet
  • Publication number: 20190121801
    Abstract: Systems, methods, and a computer readable medium are provided for generating recommendations based on semantic knowledge capture. Event data generated by domain-specific entities can be received, formatted, and aggregated so that ontological mappings can be applied to generate domain-specific event data. The ontological mappings identify relationships associated with the event data generated by two or more communicatively coupled domain-specific entities. A graph can be generated based on the domain-specific event data and provided to a user via a GUI. The graph can include nodes representing domain-specific entities and a edges representing one or more contextual relationships between two or more nodes sharing event data. The user can provide query input via the GUI to generate an updated graph corresponding to the query input. Recommendations can be provided to the user based on the query input and the contents of the updated graph.
    Type: Application
    Filed: October 17, 2018
    Publication date: April 25, 2019
    Applicant: GE Inspection Technologies, LP
    Inventors: Piyush Jethwa, Arun Karthi Subramaniyan, Alexandre Nikolov Iankoulski
  • Patent number: 8810636
    Abstract: A control signal for selectively outputting a frame of image data can be initiated using an inspection apparatus, and an inspection apparatus can process one or more frames of image data for determining a motion parameter. Responsively to the processing, the inspection apparatus can selectively output a frame of image data, improving the quality of a frame of image data output subsequently to an initiation of a control signal to selectively output a frame of image data.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: August 19, 2014
    Assignee: GE Inspection Technologies, LP
    Inventor: Clark A. Bendall
  • Patent number: 8767060
    Abstract: An inspection apparatus can include a handset and an elongated inspection tube extending from the handset. For reduction of heat energy radiating from one or more components of the apparatus, the apparatus can include a particularly designed heat sink assembly.
    Type: Grant
    Filed: October 26, 2007
    Date of Patent: July 1, 2014
    Assignee: GE Inspection Technologies, LP
    Inventors: Joshua Lynn Scott, Marjorie L. Buerkle, James J. Delmonico, Thomas W. Karpen, Joseph V. Lopez
  • Patent number: 8760447
    Abstract: A method of determining the profile of a surface of an object is disclosed that does not require that the video inspection device be at a certain angle relative to the surface when an image of the surface is obtained (e.g., allows non-perpendicular captures of the image 30). The method determines a reference surface and a reference surface line. The reference surface line is then used to determine a surface contour line on the surface of the object. The profile is then determined by determining the distances between the reference surface and the surface contour line.
    Type: Grant
    Filed: February 26, 2010
    Date of Patent: June 24, 2014
    Assignee: GE Inspection Technologies, LP
    Inventors: Clark Alexander Bendall, Michael M. Ball
  • Patent number: 8680852
    Abstract: A method of detecting defects using eddy currents is disclosed. The method comprises: exciting eddy currents in a test material using an eddy current probe driven by a drive signal; detecting induced eddy currents in the test material; converting the detected signal into integer values using an analog to digital converter; and adding or subtracting the generated integer values to or from each of two accumulators, or taking no action, so that one accumulator produces a value proportional to one component of the detected signal and the other produces a value proportional to another component of the detected signal and using these values to detect the presence of a defect.
    Type: Grant
    Filed: February 6, 2009
    Date of Patent: March 25, 2014
    Assignee: GE Inspection Technologies Ltd.
    Inventors: Alan Daly, Xiaoyu Qiao, Ian Christopher Mayes, John Hansen
  • Patent number: 8625434
    Abstract: An inspection apparatus can be provided in a system with a workstation computer. In one embodiment, the inspection apparatus can include a user interface enabling the inspection apparatus to initiate, responsively to an action by an inspector, an IP based voice communication connection with an external computer of the system. In one embodiment, the inspection apparatus and the workstation computer can be in communication with a central server that can receive data collected by said the inspection apparatus and can receive data requests from the workstation computer.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: January 7, 2014
    Assignee: GE Inspection Technologies LP
    Inventors: Bradford Morse, Thomas D. Britton, James Jonathon Delmonico
  • Patent number: 8596127
    Abstract: The invention relates to a method for processing signals which are generated by the reflection of ultrasonic waves by defects in the surface of objects during the non-destructive testing of objects such as pipes, bars, sheet metal, or uniform and complex carbon-fiber components. Said method comprises the following steps: emission of a complete wavefront onto at least one test section of the object, using a plurality of independent emission elements; receiving a wave reflected by the structure of the object by means of a plurality of receiver elements that are independent of one another; digitalization of the signals received by the receiver elements in digitizing steps; continuous modification of delay values and/or the number of receiver elements for each digitalization step (on-the-fly).
    Type: Grant
    Filed: May 28, 2009
    Date of Patent: December 3, 2013
    Assignee: GE Inspection Technologies
    Inventors: Stephan Falter, Roman Koch, Walter De Odorico, Gerhard Finger, Klaus-Peter Busch
  • Publication number: 20130317295
    Abstract: An apparatus for use as a light assembly in remote visual inspection devices is provided. The light assembly may consist of a laser diode coupled to a fiber optic bundle that transmits collimated laser light onto a wavelength converter located in the distal end of the remote video inspection system. Wavelength converters consisting of phosphorescent materials can be used to convert collimated laser light into white light for inspection illumination purposes.
    Type: Application
    Filed: December 29, 2006
    Publication date: November 28, 2013
    Applicant: GE Inspection Technologies
    Inventor: Bradford Morse
  • Patent number: 8514278
    Abstract: An inspection apparatus can comprise at least one light source for illuminating a target. The at least one light source can be disposed and/or controlled in such manner as to reduce a heat generation by the at least one light source and in such manner as to reduce a power consumption of the at least one light source.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: August 20, 2013
    Assignee: GE Inspection Technologies LP
    Inventors: Thomas W. Karpen, Bradford Morse, James Jonathon Delmonico
  • Patent number: 8434936
    Abstract: A method for performing ultrasonic testing comprising, in one embodiment, the steps of firing an ultrasonic transducer to generate an ultrasonic pulse that passes through a delay line, measuring a delay echo time of flight, and determining the temperature of the delay line using the delay echo time of flight, thereby eliminating the need for additional temperature measuring devices. Other embodiments further comprise the step of using the temperature of the delay line to determine the temperature of a test object, and using the temperature of the test object to determine a thickness of the test object that is compensated for thermal expansion and temperature dependent ultrasonic velocity.
    Type: Grant
    Filed: October 16, 2009
    Date of Patent: May 7, 2013
    Assignee: GE Inspection Technologies, LP
    Inventors: John Michael Cuffe, James Barshinger, Ying Fan
  • Patent number: 8368749
    Abstract: An inspection apparatus can be operated to collect files during performance of an inspection. An inspection apparatus can associate metadata to a collected file. In one embodiment metadata associated with a collected file can include an article identifier. In one embodiment metadata that is associated with a collected file can include data input into an inspection apparatus by an inspector. In one embodiment metadata that is associated with a collected media file can include sensor output data. An inspection apparatus in one embodiment can include an application guiding an inspector in the performance of an inspection.
    Type: Grant
    Filed: December 22, 2006
    Date of Patent: February 5, 2013
    Assignee: GE Inspection Technologies LP
    Inventors: Thomas Eldred Lambdin, Bradford Morse, Clark A. Bendall, Edward B. Hubben, Thomas W. Karpen, Bruce A. Pellegrino
  • Patent number: 8356527
    Abstract: An elongated insertion tube can be provided having a wall having one or multiple layers. A layer of a wall can include composite material having healing agent storage structures that store healing agent material and a catalyst dispersed within a polymer matrix. The layer can be formed so that when force is imparted to the layer, healing agent material stored within a storage structure reacts with a catalyst and polymerizes, to heal damage imparted to the layer.
    Type: Grant
    Filed: August 7, 2008
    Date of Patent: January 22, 2013
    Assignee: GE Inspection Technologies, LP
    Inventor: Craig Alan Hudson
  • Patent number: 8253782
    Abstract: An industrial inspection handset is disclosed, comprising a connector for connecting a peripheral device to the handset, wherein the connector is oriented such that the peripheral device can extend substantially parallel to the housing surface of the handset, and a cover tethered to the handset by a first tab, wherein the cover when mounted on the housing of the handset encloses the connector and the peripheral device. In an alternative embodiment, the handset comprises a connector oriented such that the peripheral device can extend substantially perpendicular to the housing surface of the handset, and a cover tethered to the handset by a first tab and a second tab, wherein the cover when mounted on the mounting member encloses the connector.
    Type: Grant
    Filed: October 26, 2007
    Date of Patent: August 28, 2012
    Assignee: GE Inspection Technologies, LP
    Inventors: Joshua Lynn Scott, James J. Delmonico, Joseph V. Lopez, Todd B. Abernethy
  • Patent number: 8217646
    Abstract: An inspection apparatus is provided that can include at least one probe receiving unit. The at least one probe receiving unit can be capable of processing data corresponding to one or more of image information of the type that can be generated by a visual inspection probe, eddy current information of the type that can be generated by a eddy current probe, and ultrasound information of the type that can be generated by a ultrasound probe.
    Type: Grant
    Filed: October 17, 2008
    Date of Patent: July 10, 2012
    Assignee: GE Inspection Technologies, LP
    Inventor: Thomas Karpen
  • Patent number: 8213676
    Abstract: An inspection apparatus can process image data of one or more frames. In one aspect processing of image data can include processing for determination of a motion parameter. In one aspect an inspection apparatus can be controlled responsively to the processing of image data for determination of a motion parameter.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: July 3, 2012
    Assignee: GE Inspection Technologies LP
    Inventor: Clark A. Bendall
  • Patent number: 8210046
    Abstract: In one embodiment of the invention, a composition for a damping wedge in an ultrasonic probe having a wedge body is disclosed, the composition including: a viscoelastic material having a ratio of the imaginary part to the real part of the modulus of elasticity of at least about 5% and an acoustic impedance less than that of the wedge body; a filament-shaped filler in an effective amount to provide good dispersability in the viscoelastic material and to substantially match the acoustic impedance of the damping wedge to the wedge body; and a viscosity enhancer in an effective amount to increase the viscosity of the composition to maintain a homogenous distribution of the filament-shaped filler by preventing the filament-shaped filler from settling.
    Type: Grant
    Filed: August 7, 2008
    Date of Patent: July 3, 2012
    Assignee: GE Inspection Technologies, LP
    Inventors: Wei Luo, Paul Aloysius Meyer
  • Patent number: 8199813
    Abstract: A method for embedding frames of image data in a streaming video is disclosed, comprising the steps of receiving a plurality of frames of image data of a target object over a period of time; compressing the plurality of frames of image data; embedding the plurality of compressed frames of image data in a streaming video; initiating a control signal during the period of time to embed a particular frame of image data; selecting a frame of image data from the plurality of frames of image data received near the time the control signal is initiated; embedding a user data marker in the streaming video; and embedding the selected frame of image data in the streaming video as user data, wherein the embedded selected frame of image data has a higher quality than the embedded plurality of compressed frames of image data.
    Type: Grant
    Filed: December 18, 2007
    Date of Patent: June 12, 2012
    Assignee: GE Inspection Technologies
    Inventors: Clark Alexander Bendall, Bradford Morse, Thomas Eldred Lambdin