Patents Assigned to GE Inspection Technologies, LP
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Patent number: 11639872Abstract: Systems, methods, and computer readable medium are provided for determining interferometric data and spectral data associated with combustion conditions of a flame in a combustion chamber using a sensor head including a first vacuum cavity, a diaphragm operatively interfaced to an inner portion of the combustion chamber, and an optical sensor interrogator configured on a computing device and coupled to the sensor head via optical fibers. The optical sensor interrogator including an interferometer configured to determine interferometric data associated with the flame based on light transmitted and reflected via a first optical fiber and a spectrometer configured to determine spectral data associated with the flame based on light transmitted via a second optical fiber.Type: GrantFiled: April 3, 2020Date of Patent: May 2, 2023Assignee: GE Inspection Technologies, LPInventor: Michael Charles Spalding
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Patent number: 10817152Abstract: A method can include receiving data identifying an industrial asset. The method can also include receiving data characterizing one or more sensors configured to detect a first property of the asset. The method can further include determining a first graphical representation of the asset based on the received data identifying the industrial asset, and a second graphical representation of a first sensor of the one or more sensors based on the received data characterizing one or more properties of one or more sensors. The method can further include rendering, in a graphical display space, the first graphical representation and the second graphical representation. One or more visual properties of the second graphical representation can be indicative of one or more properties of the first sensor and/or the detected first property of the asset.Type: GrantFiled: September 11, 2018Date of Patent: October 27, 2020Assignee: GE Inspection Technologies, LPInventors: Bobby Dale Hournbuckle, Jr., Matthew Harvey Krohn, Mark Rosenberg, Tara Merry, Naren Pradyumna Dasu, Mary Campos, Williams Garcia, Grigory Nudelman
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Patent number: 10539515Abstract: Method and apparatus are provided for calibration or verification of accuracy specification of a computed tomographic system. In one embodiment, the apparatus can include a base structure, a first set of test objects arranged along a first axis and coupled to the base structure, and a second set of test objects arranged along a second axis and coupled to the base structure. The first set of test objects and the second set of test objects have a first geometry. The apparatus can also include a third set of test objects and a fourth set of test objects. The third set of test objects, and the fourth set of test objects have a second geometry different from the first geometry. Locations of the first, second third and fourth set of test objects are spatially fixed with respect to the base structure. The apparatus is a test specimen adapted for calibration or accuracy verification of computed tomography system.Type: GrantFiled: March 30, 2018Date of Patent: January 21, 2020Assignee: GE Inspection Technologies, LPInventors: Andreas Fischer, Nils Rothe, Alexander Suppes, Eugen Trapet
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Publication number: 20190121801Abstract: Systems, methods, and a computer readable medium are provided for generating recommendations based on semantic knowledge capture. Event data generated by domain-specific entities can be received, formatted, and aggregated so that ontological mappings can be applied to generate domain-specific event data. The ontological mappings identify relationships associated with the event data generated by two or more communicatively coupled domain-specific entities. A graph can be generated based on the domain-specific event data and provided to a user via a GUI. The graph can include nodes representing domain-specific entities and a edges representing one or more contextual relationships between two or more nodes sharing event data. The user can provide query input via the GUI to generate an updated graph corresponding to the query input. Recommendations can be provided to the user based on the query input and the contents of the updated graph.Type: ApplicationFiled: October 17, 2018Publication date: April 25, 2019Applicant: GE Inspection Technologies, LPInventors: Piyush Jethwa, Arun Karthi Subramaniyan, Alexandre Nikolov Iankoulski
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Patent number: 8810636Abstract: A control signal for selectively outputting a frame of image data can be initiated using an inspection apparatus, and an inspection apparatus can process one or more frames of image data for determining a motion parameter. Responsively to the processing, the inspection apparatus can selectively output a frame of image data, improving the quality of a frame of image data output subsequently to an initiation of a control signal to selectively output a frame of image data.Type: GrantFiled: December 20, 2006Date of Patent: August 19, 2014Assignee: GE Inspection Technologies, LPInventor: Clark A. Bendall
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Patent number: 8767060Abstract: An inspection apparatus can include a handset and an elongated inspection tube extending from the handset. For reduction of heat energy radiating from one or more components of the apparatus, the apparatus can include a particularly designed heat sink assembly.Type: GrantFiled: October 26, 2007Date of Patent: July 1, 2014Assignee: GE Inspection Technologies, LPInventors: Joshua Lynn Scott, Marjorie L. Buerkle, James J. Delmonico, Thomas W. Karpen, Joseph V. Lopez
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Patent number: 8760447Abstract: A method of determining the profile of a surface of an object is disclosed that does not require that the video inspection device be at a certain angle relative to the surface when an image of the surface is obtained (e.g., allows non-perpendicular captures of the image 30). The method determines a reference surface and a reference surface line. The reference surface line is then used to determine a surface contour line on the surface of the object. The profile is then determined by determining the distances between the reference surface and the surface contour line.Type: GrantFiled: February 26, 2010Date of Patent: June 24, 2014Assignee: GE Inspection Technologies, LPInventors: Clark Alexander Bendall, Michael M. Ball
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Patent number: 8625434Abstract: An inspection apparatus can be provided in a system with a workstation computer. In one embodiment, the inspection apparatus can include a user interface enabling the inspection apparatus to initiate, responsively to an action by an inspector, an IP based voice communication connection with an external computer of the system. In one embodiment, the inspection apparatus and the workstation computer can be in communication with a central server that can receive data collected by said the inspection apparatus and can receive data requests from the workstation computer.Type: GrantFiled: December 29, 2006Date of Patent: January 7, 2014Assignee: GE Inspection Technologies LPInventors: Bradford Morse, Thomas D. Britton, James Jonathon Delmonico
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Patent number: 8514278Abstract: An inspection apparatus can comprise at least one light source for illuminating a target. The at least one light source can be disposed and/or controlled in such manner as to reduce a heat generation by the at least one light source and in such manner as to reduce a power consumption of the at least one light source.Type: GrantFiled: December 29, 2006Date of Patent: August 20, 2013Assignee: GE Inspection Technologies LPInventors: Thomas W. Karpen, Bradford Morse, James Jonathon Delmonico
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Patent number: 8434936Abstract: A method for performing ultrasonic testing comprising, in one embodiment, the steps of firing an ultrasonic transducer to generate an ultrasonic pulse that passes through a delay line, measuring a delay echo time of flight, and determining the temperature of the delay line using the delay echo time of flight, thereby eliminating the need for additional temperature measuring devices. Other embodiments further comprise the step of using the temperature of the delay line to determine the temperature of a test object, and using the temperature of the test object to determine a thickness of the test object that is compensated for thermal expansion and temperature dependent ultrasonic velocity.Type: GrantFiled: October 16, 2009Date of Patent: May 7, 2013Assignee: GE Inspection Technologies, LPInventors: John Michael Cuffe, James Barshinger, Ying Fan
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Patent number: 8368749Abstract: An inspection apparatus can be operated to collect files during performance of an inspection. An inspection apparatus can associate metadata to a collected file. In one embodiment metadata associated with a collected file can include an article identifier. In one embodiment metadata that is associated with a collected file can include data input into an inspection apparatus by an inspector. In one embodiment metadata that is associated with a collected media file can include sensor output data. An inspection apparatus in one embodiment can include an application guiding an inspector in the performance of an inspection.Type: GrantFiled: December 22, 2006Date of Patent: February 5, 2013Assignee: GE Inspection Technologies LPInventors: Thomas Eldred Lambdin, Bradford Morse, Clark A. Bendall, Edward B. Hubben, Thomas W. Karpen, Bruce A. Pellegrino
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Patent number: 8356527Abstract: An elongated insertion tube can be provided having a wall having one or multiple layers. A layer of a wall can include composite material having healing agent storage structures that store healing agent material and a catalyst dispersed within a polymer matrix. The layer can be formed so that when force is imparted to the layer, healing agent material stored within a storage structure reacts with a catalyst and polymerizes, to heal damage imparted to the layer.Type: GrantFiled: August 7, 2008Date of Patent: January 22, 2013Assignee: GE Inspection Technologies, LPInventor: Craig Alan Hudson
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Patent number: 8253782Abstract: An industrial inspection handset is disclosed, comprising a connector for connecting a peripheral device to the handset, wherein the connector is oriented such that the peripheral device can extend substantially parallel to the housing surface of the handset, and a cover tethered to the handset by a first tab, wherein the cover when mounted on the housing of the handset encloses the connector and the peripheral device. In an alternative embodiment, the handset comprises a connector oriented such that the peripheral device can extend substantially perpendicular to the housing surface of the handset, and a cover tethered to the handset by a first tab and a second tab, wherein the cover when mounted on the mounting member encloses the connector.Type: GrantFiled: October 26, 2007Date of Patent: August 28, 2012Assignee: GE Inspection Technologies, LPInventors: Joshua Lynn Scott, James J. Delmonico, Joseph V. Lopez, Todd B. Abernethy
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Patent number: 8217646Abstract: An inspection apparatus is provided that can include at least one probe receiving unit. The at least one probe receiving unit can be capable of processing data corresponding to one or more of image information of the type that can be generated by a visual inspection probe, eddy current information of the type that can be generated by a eddy current probe, and ultrasound information of the type that can be generated by a ultrasound probe.Type: GrantFiled: October 17, 2008Date of Patent: July 10, 2012Assignee: GE Inspection Technologies, LPInventor: Thomas Karpen
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Patent number: 8213676Abstract: An inspection apparatus can process image data of one or more frames. In one aspect processing of image data can include processing for determination of a motion parameter. In one aspect an inspection apparatus can be controlled responsively to the processing of image data for determination of a motion parameter.Type: GrantFiled: December 20, 2006Date of Patent: July 3, 2012Assignee: GE Inspection Technologies LPInventor: Clark A. Bendall
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Patent number: 8210046Abstract: In one embodiment of the invention, a composition for a damping wedge in an ultrasonic probe having a wedge body is disclosed, the composition including: a viscoelastic material having a ratio of the imaginary part to the real part of the modulus of elasticity of at least about 5% and an acoustic impedance less than that of the wedge body; a filament-shaped filler in an effective amount to provide good dispersability in the viscoelastic material and to substantially match the acoustic impedance of the damping wedge to the wedge body; and a viscosity enhancer in an effective amount to increase the viscosity of the composition to maintain a homogenous distribution of the filament-shaped filler by preventing the filament-shaped filler from settling.Type: GrantFiled: August 7, 2008Date of Patent: July 3, 2012Assignee: GE Inspection Technologies, LPInventors: Wei Luo, Paul Aloysius Meyer
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Patent number: 8192075Abstract: Methods of performing ultrasonic testing are disclosed, comprising the step of determining a temperature gradient of an ultrasonic wedge. In one embodiment of the invention, the method further comprises the steps of determining a sound velocity gradient of the ultrasonic wedge to determine the time it takes for sound waves emanating from a plurality of ultrasonic transducer elements attached to the ultrasonic wedge to reach a point of interest within a test object, and firing each of the ultrasonic transducer elements in a timed sequence based on the times such that sound waves from each of the ultrasonic transducer elements reach the point of interest at the same time. In other embodiments of the invention, the total attenuation and acoustic impedance of a sound wave traveling through the ultrasonic wedge is determined to adjust the amplitude of the sound wave such that the sound wave has sufficient amplitude to perform the ultrasonic testing.Type: GrantFiled: August 19, 2008Date of Patent: June 5, 2012Assignee: GE Inspection Technologies, LPInventor: Anand Desai
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Patent number: 8118733Abstract: Heat isolation and relocation systems and methods are provided to enable utilization of a remote viewing device in a wider range of temperature environments and while operating its one or more light sources at or near full power without fear of causing temperature-related harm to the one or more light sources and/or to the imager, even if the imager is positioned nearby the one or more light sources.Type: GrantFiled: December 22, 2006Date of Patent: February 21, 2012Assignee: GE Inspection Technologies, LPInventors: Joshua L. Scott, Thomas W. Karpen
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Patent number: 8007288Abstract: An apparatus for connecting a multi-conductor cable of a first device to a pin grid array connector of a second device, wherein said apparatus comprises a first printed circuit board (PCB) for terminating the conductors of the cable, which are connected to a first PCB surface mounted connector mounted on the first PCB. The first PCB surface mounted connector is mated with a second PCB surface mounted connector mounted on a second PCB, on which a PCB surface mounted socket grid array is also mounted for mating to the pin grid array connector of the second device. This apparatus allows the same (i.e., standardized) multi-conductor cable with the same first PCB and the same first PCB surface mounted connector to be used regardless of what style connector is used by the second device.Type: GrantFiled: September 25, 2009Date of Patent: August 30, 2011Assignee: GE Inspection Technologies, LP.Inventors: Kelley E. Yetter, Anand Desai, John Pyle, Jae Choi
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Patent number: 7961401Abstract: A system for providing a two-position zoom-focus capability in a video inspection device comprising, in one embodiment, a focus lens cell and primary aperture attached to a set of fixed rails and connected to a zoom lens cell. In one embodiment, the focus lens cell is moveable into a first position along the rails through activation of a proximally located lens movement mechanism, and moveable into a second position through relaxation of a tensioned focus spring. In one embodiment, movement of the focus lens cell between first and second focus positions causes movement of the zoom lens cell and a secondary aperture between corresponding first and second zoom and aperture positions to provide unmagnified and magnified images of a target object.Type: GrantFiled: December 23, 2009Date of Patent: June 14, 2011Assignee: GE Inspection Technologies, LPInventors: Joshua Lynn Scott, Clark Alexander Bendall, Theodore Alexander Chilek