Abstract: Methods techniques have been developed for making dielectric measurements of materials in the near field of microwave antennas. These techniques overcome the limitations of previous devices as the size, shape, orientation, and location of a sample can have a substantial impact on dielectric measurements.
Type:
Application
Filed:
April 12, 2001
Publication date:
May 2, 2002
Applicant:
General Dielectric, Inc.
Inventors:
DeWitt C. Seward, John LaChapelle, D. Clint Seward