Patents Assigned to General Neontechnology, LLC - Justia Patents Search

Patents Assigned to General Neontechnology, LLC

Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images

Patent number: 6229138

Abstract: A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.

Type: Grant

Filed: September 8, 2000

Date of Patent: May 8, 2001

Assignee: General Neontechnology, LLC

Inventor: Vic B. Kley