Abstract: A method for classifying pixels in an image, e.g. a microscopy image, as being associated with a feature of interest has been described. A color brightfield microscopy image represented by color values for an array of pixels is conventionally obtained. The image is over-segmented based on the color values to provide a plurality of groups of contiguous pixels with related color values, whereby a typical feature of interest will be represented by multiple segments. A list of pairs of segments which are adjacent to one another in the image is generated, and a difference in average color value between the segments comprising each pair is determined. Pairs of adjacent segments are then selectively joined together to form a joined segment to replace the corresponding pair of segments in the list if pre-defined joining criteria are met. The pairs are considered for joining in an order based on their respective differences in average color value.

Abstract: A method for generating a fluorescence microscopy image of a sample. The method comprises a step of obtaining a series of fluorescence microscopy images of the sample for a plurality of different focal plane depths in the sample and different exposure times. The images may be obtained directly from a microscope, or from a library of images. Images comprising the series of fluorescence microscopy images are combined to form a single resultant fluorescence microscopy image of the sample. The single resultant image may then be analyzed as if it were a conventional fluorescence microscopy image, e.g. by visual inspection or numerical processing. However, because the resultant image is based on images from a range of focal plane depths and exposure times, different structures that appear under only certain conditions (i.e. in only certain ones of the original series of fluorescence microscopy images) can appear together in a single image, thus simplifying visualization, interpretation and analysis of the sample.

Abstract: The present invention provides methods and systems for automatic detection of the location of cell colonies on a specimen slide, in particular under the coverslip of a specimen slide. Slide scanning can be performed using an automated microscope with motorized axes. The location of the colonies can be determined by image analysis, which is followed by automatically finding metaphase cells and associating them with each colony. The invention also provides an automated, Hough-transform-based method for identifying the location of the slide coverslip and, if desired, analyzing only the image area contained within the coverslip.

Abstract: A method for classifying pixels in an image, e.g. a microscopy image, as being associated with a feature of interest has been described. A color brightfield microscopy image represented by color values for an array of pixels is conventionally obtained. The image is over-segmented based on the color values to provide a plurality of groups of contiguous pixels with related color values, whereby a typical feature of interest will be represented by multiple segments. A list of pairs of segments which are adjacent to one another in the image is generated, and a difference in average color value between the segments comprising each pair is determined. Pairs of adjacent segments are then selectively joined together to form a joined segment to replace the corresponding pair of segments in the list if pre-defined joining criteria are met. The pairs are considered for joining in an order based on their respective differences in average color value.

Abstract: A method for generating a fluorescence microscopy image of a sample. The method comprises a step of obtaining a series of fluorescence microscopy images of the sample for a plurality of different focal plane depths in the sample and different exposure times. The images may be obtained directly from a microscope, or from a library of images. Images comprising the series of fluorescence microscopy images are combined to form a single resultant fluorescence microscopy image of the sample. The single resultant image may then be analyzed as if it were a conventional fluorescence microscopy image, e.g. by visual inspection or numerical processing. However, because the resultant image is based on images from a range of focal plane depths and exposure times, different structures that appear under only certain conditions (i.e. in only certain ones of the original series of fluorescence microscopy images) can appear together in a single image, thus simplifying visualization, interpretation and analysis of the sample.