Abstract: A magnetometer-based monitoring system comprising a magnet integrated with an object whose disposition is to be monitored, a first magnetometer secured in proximity to the object, and a second magnetometer secured at a fixed distance from the first magnetometer in proximity to the object. The monitoring system further comprising a processor to receive data from the first magnetometer and the second magnetometer, and calculate a measurement vector to determine the disposition of the object.
Type:
Grant
Filed:
July 12, 2016
Date of Patent:
May 1, 2018
Assignee:
Getchell Technologies LLC
Inventors:
Mark A. Readdie, Jeremy G. Chatwin, Omondi L. Nyong'o