Abstract: A method, system, and apparatus use in locating a structure in an integrated circuit are provided. Electrical activities are induced in the IC for producing respective unique electromagnetic radiation patterns that collectively contain information on the location of the structure. The electromagnetic radiation patterns are detected, and an area of interest for locating the structure is determined from correlations in the electromagnetic radiation patterns. Once the area of interest is identified a user can more easily locate the structure on the integrated circuit by focusing on the area of interest.