Patents Assigned to Global Unichip (Nanjing) Ltd.
  • Testing system and testing method
    Patent number: 10776558
    Abstract: A testing method includes the following operations: performing a place and route procedure according to a netlist file corresponding to a chip to generate first layout data; determining whether to replace a flip-flop circuit in the chip with a gated flip-flop circuit according to the first layout data to generate second layout data; and running a test on the chip according to the second layout data.
    Type: Grant
    Filed: March 21, 2019
    Date of Patent: September 15, 2020
    Assignee: Global Unichip (Nanjing) Ltd.
    Inventors: Shih-Hsin Chen, Te-Hsun Fu, Ming-Tung Chang