Patents Assigned to GLOBAL FOUNDRIES US INC.
  • STAGGERED ELECTRICAL FRAME STRUCTURES FOR FRAME AREA REDUCTION
    Publication number: 20150294918
    Abstract: A method of forming a group of probe pads or sets of probe pads and DUTs in a staggered pattern within a portion of a pad row and the resulting device are disclosed. Embodiments include forming a first group of probe pads or sets of probe pads and DUTs in a pad row on a wafer; and forming a second group of probe pads and DUTs in the pad row on the wafer, wherein the probe pads or sets of probe pads of the first group are staggered along the pad row, and each DUT of the first group is aligned with a probe pad perpendicular to the pad row.
    Type: Application
    Filed: April 11, 2014
    Publication date: October 15, 2015
    Applicant: GLOBAL FOUNDRIES US INC.
    Inventor: Ricardo MIKALO