Patents Assigned to GLTTEK CO., LTD
  • Publication number: 20240408724
    Abstract: A recycle grinding device is provided. A grinding device for cleaning probes includes a placement platform and a grinding block. The grinding block is located in the placement space. The grinding block includes a base layer and a grinding layer. The grinding layer covers the base layer and is integrally formed with the base layer, wherein the thickness of the grinding layer is greater than or equal to 1 millimeter. Therefore, the invention provides users with convenient cleaning, reduced replacement frequency, and improved performance and quality.
    Type: Application
    Filed: September 6, 2023
    Publication date: December 12, 2024
    Applicant: GLTTEK CO., LTD
    Inventor: Chiung-Nan CHEN
  • Patent number: 11745307
    Abstract: An automatic grinding machine with positioning effect has a body, at least two positioning sets, and a processing set. The body has a base, a grinding mount, a drive device, and a fixture. The base has a chamber. The at least two positioning sets are connected to the body and each positioning set has a displacement device and an optical module. The displacement device is mounted in the chamber. The optical module is disposed on the displacement device and is moved relative to the grinding mount by the drive device to position locations of the grinding mount and a probe card. The processing set is electrically connected to the drive device and the fixture of the body and the displacement device and the optical module of each positioning set, and has a computer control interface.
    Type: Grant
    Filed: February 11, 2021
    Date of Patent: September 5, 2023
    Assignee: GLTTEK CO., LTD
    Inventors: Chiung Nan Chen, Hsun Hao Chan
  • Patent number: 9983145
    Abstract: A test probe card detection system includes a linear scanning lens module, a CCD microscope module, a CCD image adjustment module, and a computer. The CCD microscope module adjusts and confirms a scanning optical focal length of a test probe card to be tested. The linear scanning lens module scans all areas data of the test probe card and stores the scanned all areas data in a database. The all areas data is compared with a coordinate file in order to detect defected pins of the test probe card. The CCD microscope module confirms and obtains data of the detected defected pins of the test probe card. The data of the detected defected pins is sent to the CCD image adjustment module and are shown on the computer. The defected pins include pins having surface oxidation, wear, damage, and breaking; lacking of pins; and deflected pins.
    Type: Grant
    Filed: July 12, 2017
    Date of Patent: May 29, 2018
    Assignee: GLTTEK CO., LTD
    Inventor: Chiung Nan Chen
  • Patent number: 9915581
    Abstract: A seal detecting device and means for detecting a leakage on an outer case of an electronic device include providing a through hole on the outer case of the electronic device, an inner side of the electronic device is connected to an outer side of the electronic device; providing an airtight container, placing the outer case of the electronic device into the airtight container, one of the inner side and outer side of the outer case is defined as a gas supply side, and the other side is a detecting side; supplying compressed gas to the gas supply side; leading the detecting side to outside and detect a gas flow, so as to detect if there is a leakage on the outer case of the electronic device. The device and means have the advantages of high sensitivity, quick detecting speed, and high accuracy.
    Type: Grant
    Filed: March 31, 2016
    Date of Patent: March 13, 2018
    Assignee: GLTTEK CO., LTD
    Inventor: Chiung Nan Chen