Abstract: A precision clamping assembly has a body, two clamping arms, and a drive device. The body has a first direction, a second direction, a chamber formed in the body, and an opening formed through an outer side of the body along the second direction and communicating with the chamber. The clamping arms are pivotally and movably connected to the body, and each clamping arm is disposed in the chamber and has a pivot end and a clamping end extended out of the body via the opening. The clamping ends are selectively moved toward or away from each other along the second direction and selectively moved same or opposite from each other along a third direction. The drive device is connected to the body and the two clamping arms, and has two driving sets disposed in the body and respectively connected to the two clamping arms.

Abstract: An automatic grinding machine with positioning effect has a body, at least two positioning sets, and a processing set. The body has a base, a grinding mount, a drive device, and a fixture. The base has a chamber. The at least two positioning sets are connected to the body and each positioning set has a displacement device and an optical module. The displacement device is mounted in the chamber. The optical module is disposed on the displacement device and is moved relative to the grinding mount by the drive device to position locations of the grinding mount and a probe card. The processing set is electrically connected to the drive device and the fixture of the body and the displacement device and the optical module of each positioning set, and has a computer control interface.

Abstract: A test probe card detection system includes a linear scanning lens module, a CCD microscope module, a CCD image adjustment module, and a computer. The CCD microscope module adjusts and confirms a scanning optical focal length of a test probe card to be tested. The linear scanning lens module scans all areas data of the test probe card and stores the scanned all areas data in a database. The all areas data is compared with a coordinate file in order to detect defected pins of the test probe card. The CCD microscope module confirms and obtains data of the detected defected pins of the test probe card. The data of the detected defected pins is sent to the CCD image adjustment module and are shown on the computer. The defected pins include pins having surface oxidation, wear, damage, and breaking; lacking of pins; and deflected pins.

Abstract: A seal detecting device and means for detecting a leakage on an outer case of an electronic device include providing a through hole on the outer case of the electronic device, an inner side of the electronic device is connected to an outer side of the electronic device; providing an airtight container, placing the outer case of the electronic device into the airtight container, one of the inner side and outer side of the outer case is defined as a gas supply side, and the other side is a detecting side; supplying compressed gas to the gas supply side; leading the detecting side to outside and detect a gas flow, so as to detect if there is a leakage on the outer case of the electronic device. The device and means have the advantages of high sensitivity, quick detecting speed, and high accuracy.