Patents Assigned to Good Advance Industries (H.K.) Limited
  • Methods and systems for white light interferometry and characterization of films
    Patent number: 7649634
    Abstract: Methods are provided for estimating a surface profile of a sample in an interferometer having a broad bandwidth light source. The interferometer detects interference pattern intensity data over a series of frames of a relative scan between the sample and a reference surface.
    Type: Grant
    Filed: October 30, 2007
    Date of Patent: January 19, 2010
    Assignees: Mountain View Optical Consultant Corp., Good Advance Industries (H.K.) Limited
    Inventor: Der-Shen Wan