Patents Assigned to GOPEL electronic GmbH
  • System and method for optimized board test and configuration
    Patent number: 9164858
    Abstract: The present invention, system and method for optimized board test and configuration, comprises a method for splitting test data into dynamic and static parts, a system for optimized test access using variable-length shift register (VLSR) that uses the latter method, a system for optimized test application using VLSR with accumulating buffer (VLSRB) and a method for switching between BS-based test and VLSR/VLSRB-based test.
    Type: Grant
    Filed: March 29, 2013
    Date of Patent: October 20, 2015
    Assignees: TESTONICA LAB OU, GOPEL ELECTRONIC GMBH
    Inventors: Sergei Devadze, Artur Jutman, Igor Aleksejev, Konstantin Shibin, Thomas Wenzel
  • System and method for optimized board test and configuration
    Publication number: 20140298125
    Abstract: The present invention, system and method for optimized board test and configuration, comprises a method for splitting test data into dynamic and static parts, a system for optimized test access using variable-length shift register (VLSR) that uses the latter method, a system for optimized test application using VLSR with accumulating buffer (VLSRB) and a method for switching between BS-based test and VLSR/VLSRB-based test.
    Type: Application
    Filed: March 29, 2013
    Publication date: October 2, 2014
    Applicants: Testonica Lab OU, GOPEL electronic GmbH
    Inventors: Sergei DEVADZE, Artur JUTMAN, Igor ALEKSEJEV, Konstantin SHIBIN, Thomas WENZEL