Abstract: A method of examining an object containing a polycrystalline material, in which at least one part of the surface of the object is illuminated with substantially isotropic light, as well as a illumination device for carrying out the method. In this manner, the polycrystalline material is less influenced by the different reflection characteristics of individual particles of the polycrystalline material.
Type:
Grant
Filed:
September 14, 2009
Date of Patent:
February 2, 2016
Assignee:
GP Inspect GmbH
Inventors:
Vitaly Bezgachev, Marc Hemsendorf, Christian Probst, Stefan Recht, Stephanus Wansleben
Abstract: A method for detecting defects in an object includes a step of locally illuminating the object by radiating in light having a wavelength to which the object is transparent. Multiply reflected components of the incident light are detected while the detection of directly transmitted components of the incident light is at least partly avoided and the detection of singly reflected components of the incident light is at least partly avoided. Defects are identified by evaluating intensity differences in the detected components of the incident light. There is also disclosed a device for carrying out the method.
Abstract: A method for detecting defects in an object includes a step of locally illuminating the object by radiating in light having a wavelength to which the object is transparent. Multiply reflected components of the incident light are detected while the detection of directly transmitted components of the incident light is at least partly avoided and the detection of singly reflected components of the incident light is at least partly avoided. Defects are identified by evaluating intensity differences in the detected components of the incident light. There is also disclosed a device for carrying out the method.
Abstract: A method of examining an object containing a polycrystalline material, in which at least one part of the surface of the object is illuminated with substantially isotropic light, as well as a illumination device for carrying out the method. In this manner, the polycrystalline material is less influenced by the different reflection characteristics of individual particles of the polycrystalline material.
Type:
Application
Filed:
September 14, 2009
Publication date:
April 8, 2010
Applicant:
GP INSPECT GMBH
Inventors:
Vitaly Bezgachev, Marc Hemsendorf, Christian Probst, Stefan Recht, Stephanus Wansleben