Patents Assigned to GRAFTEK IMAGING INC.
  • Publication number: 20160025651
    Abstract: A lighting dome that can be used to inspect semiconductor wafers can include a small aperture, backlighting, a reflectance gradient and/or a broad spectrum light source.
    Type: Application
    Filed: October 7, 2015
    Publication date: January 28, 2016
    Applicant: GRAFTEK IMAGING INC.
    Inventors: Romik Chatterjee, Robert Martin Eastlund, Christopher Jan Koci, Archer Forrest Finley
  • Patent number: 9157867
    Abstract: A lighting dome that can be used to inspect semiconductor wafers includes a small aperture, and can include backlighting, a reflectance gradient and/or a broad spectrum light source. A pin hole lens is aligned with the small aperture.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: October 13, 2015
    Assignee: GRAFTEK IMAGING INC.
    Inventors: Romik Chatterjee, Robert Martin Eastlund, Christopher Jan Koci, Archer Forrest Finley