Patents Assigned to GRALE TECHNOLOGIES
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Patent number: 11809155Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements a morphic manufacturing approach that integrates in situ inspection and related decision-making into the manufacturing process. After execution of a machining or deposition operation, the system performs a sensor scan to collect sensor measurement data for the resulting part while the part remains in the manufacturing work cell. The measurement data is compared with an as-designed digital model of the part to determine whether further machining or deposition is necessary to bring the finished part into tolerance with the model. If necessary, the system performs another additive and/or subtractive manufacturing operation on the part based on analysis of the measurement data to bring the part into tolerance. The measured inspection data can be stored in association with each manufactured part for auditing purposes or for creation of part-specific digital twins.Type: GrantFiled: February 7, 2022Date of Patent: November 7, 2023Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, Fred Persi, Matthew Walther
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Patent number: 11656614Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.Type: GrantFiled: August 2, 2021Date of Patent: May 23, 2023Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, Fred Persi, Matthew Walther
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Patent number: 11243507Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements a morphic manufacturing approach that integrates in situ inspection and related decision-making into the manufacturing process. After execution of a machining or deposition operation, the system performs a sensor scan to collect sensor measurement data for the resulting part while the part remains in the manufacturing work cell. The measurement data is compared with an as-designed digital model of the part to determine whether further machining or deposition is necessary to bring the finished part into tolerance with the model. If necessary, the system performs another additive and/or subtractive manufacturing operation on the part based on analysis of the measurement data to bring the part into tolerance. The measured inspection data can be stored in association with each manufactured part for auditing purposes or for creation of part-specific digital twins.Type: GrantFiled: April 29, 2020Date of Patent: February 8, 2022Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, Fred Persi, Matthew Walther
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Patent number: 11079748Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.Type: GrantFiled: April 29, 2020Date of Patent: August 3, 2021Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, Fred Persi, Matthew Walther
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Patent number: 10295341Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.Type: GrantFiled: December 1, 2016Date of Patent: May 21, 2019Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, James D. Osterloh, Fred Persi
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Patent number: 9528826Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.Type: GrantFiled: November 4, 2015Date of Patent: December 27, 2016Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, James D. Osterloh, Fred Persi
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Patent number: 9222769Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.Type: GrantFiled: December 8, 2012Date of Patent: December 29, 2015Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, James D. Osterloh, Fred Persi
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Publication number: 20140157610Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.Type: ApplicationFiled: December 8, 2012Publication date: June 12, 2014Applicant: GRALE TECHNOLOGIESInventors: Michael Garvey, James D. Osterloh, Fred Persi