Abstract: A test circuit and apparatus that meets requirements of Human Body Model electrostatic discharge sensitivity testing of microelectronic components that can properly test high voltage and unconnected pins is disclosed. “No Connect” pins were exempted from HBM testing by some testing standards due to prior art testers producing unintended overstress. A HBM tester has been invented that reduces this overstressing to levels were valid testing of integrated circuit No Connect pins and pins with high voltage ESD clamping protection is possible.