Patents Assigned to GRUNDIUM OY
  • Patent number: 12114093
    Abstract: According to an aspect, there is provided an apparatus for performing the following. The apparatus obtains, periodically or regularly during imaging of an imaging target, images of different areas of the imaging target. At least some of the images overlap partially with each other. In response to detecting that an image and all images partially overlapping with said image have been obtained, the apparatus marks the image as completed. In response to detecting that a pre-defined number of images are marked as completed but not locked, the apparatus executes a partial image stitching process comprising: performing image stitching on non-locked images based on at least some obtained this far, locking stitched completed images and performing one or more actions. The one or more actions comprising outputting image information via at least one interface and/or storing the image information to a database accessible by a user and/or analysis device.
    Type: Grant
    Filed: September 5, 2023
    Date of Patent: October 8, 2024
    Assignee: Grundium Oy
    Inventors: Matti Pellikka, Kimmo Alanen
  • Patent number: 11006088
    Abstract: There is provided a method for determining colour correction parameters for a digital imaging device. The method comprises simulating target and raw value pairs for a set of colours based on pre-determined sample transmission spectra of the set of colours; i) a sensitivity spectrum of a monochrome sensor of the digital imaging device; and illumination spectra of different colours of a light source of the digital imaging device; or ii)—sensitivity spectra of pixels of different colours of a colour sensor of the digital imaging device; and an illumination spectrum of a light source of the digital imaging device. The method comprises determining a colour correction transformation for transforming the raw values to target values, wherein the colour correction transformation is parametrized by transformation parameters; and solving the transformation parameters for the colour correction transformation using an optimization problem.
    Type: Grant
    Filed: November 3, 2020
    Date of Patent: May 11, 2021
    Assignee: Grundium Oy
    Inventors: Matti Pellikka, Markus Vartiainen
  • Patent number: 10628698
    Abstract: There is provided a method comprising receiving at least three images, wherein the images form a number of partially overlapping image pairs, wherein the number of partially overlapping image pairs is at least a number of the received images; forming one or more candidate transformations between the images of the image pairs; constructing a multigraph comprising nodes representing nodal transformations from a composite image to the images of the at least three images, and edges between the nodes, the edges representing the one or more candidate transformations; solving edge weights and the nodal transformations using an optimization problem, wherein the edge weights indicate plausibility of the one or more candidate transformations; and applying the solved nodal transformations in forming the composite image of the at least three images.
    Type: Grant
    Filed: July 2, 2019
    Date of Patent: April 21, 2020
    Assignee: Grundium Oy
    Inventor: Matti Pellikka
  • Patent number: 10564408
    Abstract: An apparatus for scanning microscope slides is provided. The apparatus includes an objective; a specimen stage; a camera sensor configured to capture a first plurality of images at a first rate while focus is changed in continuous motion; and a flash unit configured to flash at a second rate, wherein the first rate and the second rate are synchronized.
    Type: Grant
    Filed: February 13, 2018
    Date of Patent: February 18, 2020
    Assignee: GRUNDIUM OY
    Inventors: Markus Vartiainen, Janne Haavisto, Matti Pellikka, Heikki Jantunen
  • Patent number: 10341551
    Abstract: A method for focusing may include receiving a first image stack of a first field of view, the first image stack including images captured with different focus from the first field of view; determining, from the first image stack, a first spatial distribution of focus depths in which different areas in the first field of view are in focus; determining a first local sample thickness and a first sample tilt in the first field of view based on the first spatial distribution of focus depths; and estimating, based on the first local sample thickness and the first sample tilt, a focus setting for capturing a second image stack from a second field of view.
    Type: Grant
    Filed: May 21, 2018
    Date of Patent: July 2, 2019
    Assignee: GRUNDIUM OY
    Inventors: Matti Pellikka, Markus Vartiainen
  • Patent number: D872789
    Type: Grant
    Filed: March 19, 2018
    Date of Patent: January 14, 2020
    Assignee: GRUNDIUM OY
    Inventor: Janne Haavisto