Patents Assigned to GTSD Sub III
  • Patent number: 6448564
    Abstract: An apparatus, methods, and systems for assaying materials are disclosed using a combination of detectors that scan for areas of material non-uniformity, and assay the type and amount of radioactivity present in the material. Scanning detectors are provided to scan for non-uniform levels of radiation emanating from the material. If any non-uniformity is detected by the scanning detectors, the material non-uniformity is removed and handled with radioactive material protocols. The remaining material may then be subject to assay. If the material shows no signs of non-uniform radiation emission, the assay detectors are used to assay the material. If the concentration of any one or more radionuclides exceeds a predetermined limit, the assayed material is handled with radioactive material protocols.
    Type: Grant
    Filed: May 30, 2000
    Date of Patent: September 10, 2002
    Assignee: GTSD Sub III
    Inventors: Alfred N. Johnson, Jeffrey W. Dickinson, John L. McGehee, David H. Weigle, Timothy B. Ramsey