Abstract: An apparatus, methods, and systems for assaying materials are disclosed using a combination of detectors that scan for areas of material non-uniformity, and assay the type and amount of radioactivity present in the material. Scanning detectors are provided to scan for non-uniform levels of radiation emanating from the material. If any non-uniformity is detected by the scanning detectors, the material non-uniformity is removed and handled with radioactive material protocols. The remaining material may then be subject to assay. If the material shows no signs of non-uniform radiation emission, the assay detectors are used to assay the material. If the concentration of any one or more radionuclides exceeds a predetermined limit, the assayed material is handled with radioactive material protocols.
Type:
Grant
Filed:
May 30, 2000
Date of Patent:
September 10, 2002
Assignee:
GTSD Sub III
Inventors:
Alfred N. Johnson, Jeffrey W. Dickinson, John L. McGehee, David H. Weigle, Timothy B. Ramsey