Patents Assigned to GuideTech, Inc.
  • Patent number: 8255188
    Abstract: Disclosed is a system and related methodology for providing fast low frequency jitter rejection in the measurement of signals under test. A signal under test may be sampled alternately with a reference signal under similar conditions. The resulting sampled signal blocks may then be processed to subtract the known calibrated value of the reference signal from the average signal under test.
    Type: Grant
    Filed: November 7, 2008
    Date of Patent: August 28, 2012
    Assignee: GuideTech, Inc.
    Inventor: Sassan Tabatabaei
  • Publication number: 20090132207
    Abstract: Disclosed is a system and related methodology for providing fast low frequency jitter rejection in the measurement of signals under test. A signal under test may be sampled alternately with a reference signal under similar conditions. The resulting sampled signal blocks may then be processed to subtract the known calibrated value of the reference signal from the average signal under test.
    Type: Application
    Filed: November 7, 2008
    Publication date: May 21, 2009
    Applicant: Guidetech, Inc.
    Inventor: Sassan Tabatabaei
  • Patent number: 7512196
    Abstract: A method of estimating random jitter from measured samples of a transmitted data signal includes a first step of obtaining a plurality of measurements (e.g., pulse widths) for selected signal edges within a transmitted data stream, where the data stream comprises a repeating data pattern having a known bit length and known number of rising edges, and wherein the time difference between adjacent measurements is determined by an event count increment equal to an integer multiple of the known number of rising edges. A time interval error (TIE) value is then computed for each measured signal edge and transformed into corresponding frequency components that are representative of both noise floor and multiple distinct frequency peaks. Noise floor is isolated and the power of the noise floor may be computed to provide an estimate of random jitter variance, from which the standard deviation may be calculated.
    Type: Grant
    Filed: June 28, 2004
    Date of Patent: March 31, 2009
    Assignee: GuideTech, Inc.
    Inventor: Sassan Tabatabaei
  • Publication number: 20080319691
    Abstract: Methodologies are disclosed for analyzing periodic jitter is a signal pattern using a continuous time interval analyzer. Sampled signal patterns may be correlated using time interval error calculations to determine start and stop sequences within sampled blocks of signal data while sampling synchronization may be achieved based on time interval calculations or pattern interval error calculations.
    Type: Application
    Filed: July 14, 2008
    Publication date: December 25, 2008
    Applicant: GuideTech Inc.
    Inventor: Sassan Tabatabaei
  • Publication number: 20080267274
    Abstract: Methodologies are disclosed for analyzing periodic jitter is a signal pattern using a continuous time interval analyzer. Sampled signal patterns may be correlated using time interval error calculations to determine start and stop sequences within sampled blocks of signal data while sampling synchronization may be achieved based on time interval calculations or pattern interval error calculations.
    Type: Application
    Filed: July 14, 2008
    Publication date: October 30, 2008
    Applicant: GuideTech Inc.
    Inventor: Sassan Tabatabaei