Patents Assigned to GX Technology Corporation
  • Patent number: 6763305
    Abstract: A method for improving illumination analysis in seismic data having steps of: selecting a model of the medium, a source and a receiver, a reflecting surface, finding a reflection point and the associated Fresnel zone according to Fermat principle using ray tracing, calculating the illumination in the Fresnel zone using the wave equation, repeating the illumination calculation for all frequencies all points on the reflecting surface and all source and the receiver pairs. The resulting illumination image may be used to assess the quality of or improve the seismic image of the same medium.
    Type: Grant
    Filed: September 13, 2002
    Date of Patent: July 13, 2004
    Assignee: GX Technology Corporation
    Inventor: Nikolaos Bernitsas
  • Publication number: 20040054477
    Abstract: A method for improving illumination analysis in seismic data having steps of: selecting a model of the medium, a source and a receiver, a reflecting surface, finding a reflection point and the associated Fresnel zone according to Fermat principle using ray tracing, calculating the illumination in the Fresnel zone using the wave equation, repeating the illumination calculation for all frequencies all points on the reflecting surface and all source and the receiver pairs. The resulting illumination image may be used to assess the quality of or improve the seismic image of the same medium.
    Type: Application
    Filed: September 13, 2002
    Publication date: March 18, 2004
    Applicant: GX Technology Corporation
    Inventor: Nikolaos Bernitsas