Abstract: There is presented a screening system and a corresponding method for screening an item. The screening system includes a detection apparatus (100), a rotatable platform (310) to receive the item, and a mechanical arrangement (320, 330). The detection apparatus has an emitter portion to generate a primary beam of ionising radiation and a detector portion to detect an absorption signal and at least one of a diffraction signal and a scattering signal. The mechanical arrangement is adapted to translate the detection apparatus along a translation axis to scan the item with the primary beam. The screening system may be used for identifying restricted or illicit substances that may be present in some luggage or in mail.

Abstract: There is presented a screening system and a corresponding method for screening an item. The screening system includes a detection apparatus (100), a rotatable platform (310) to receive the item, and a mechanical arrangement (320, 330). The detection apparatus has an emitter portion to generate a primary beam of ionising radiation and a detector portion to detect an absorption signal and at least one of a diffraction signal and a scattering signal. The mechanical arrangement is adapted to translate the detection apparatus along a translation axis to scan the item with the primary beam. The screening system may be used for identifying restricted or illicit substances that may be present in some luggage or in mail.

Abstract: A sample inspection system and a corresponding method for inspecting a sample is provided. The sample inspection system includes a beam former, a beam modulator an energy resolving detector and a collimator. The beam former is adapted to receive an electromagnetic radiation from an electromagnetic source to generate a primary beam of electromagnetic radiation. The beam modulator is provided at a distance from the beam former to define a sample chamber. The collimator is provided between the beam modulator and the energy resolving detector. The collimator has a plurality of channels adapted to receive diffracted or scattered radiation. Upon incidence of the primary beam onto the beam modulator, the beam modulator provides a reference beam of diffracted or scattered radiation. The energy resolving detector is arranged to detect the reference beam.

Abstract: A sample inspection system and a corresponding method for inspecting a sample is provided. The sample inspection system includes a beam former, a beam modulator an energy resolving detector and a collimator. The beam former is adapted to receive an electromagnetic radiation from an electromagnetic source to generate a primary beam of electromagnetic radiation. The beam modulator is provided at a distance from the beam former to define a sample chamber. The collimator is provided between the beam modulator and the energy resolving detector. The collimator has a plurality of channels adapted to receive diffracted or scattered radiation. Upon incidence of the primary beam onto the beam modulator, the beam modulator provides a reference beam of diffracted or scattered radiation. The energy resolving detector is arranged to detect the reference beam.