Abstract: The present invention relates to a millimeter or terahertz wave sensor for providing inline inspection, preferably including but not limited to continuous monitoring of objects, for example thin sheet dielectric material.
Type:
Grant
Filed:
June 13, 2016
Date of Patent:
October 1, 2019
Assignee:
HAMMER-IMS
Inventors:
Noël Deferm, Tom Redant, Wim Dehaene, Patrick Reynaert