Patents Assigned to Helmholtz-Zentrum Potsdam - Deutsches Geoforschungszentrum GFZ Stiftung des Offentlichen Rechts des
  • ION SOURCE INCLUDING STRUCTURED SAMPLE FOR IONIZATION
    Publication number: 20220102131
    Abstract: An ion source is provided that includes a structured sample and a method for the ionization and/or its enhancement is provided, which preferably relies on field emission and/or field ionization processes. These processes can be brought about by structures with appropriate geometries, which cause a high electric field gradient at or near the sample.
    Type: Application
    Filed: January 10, 2020
    Publication date: March 31, 2022
    Applicant: Helmholtz-Zentrum Potsdam - Deutsches Geoforschungszentrum GFZ Stiftung des Offentlichen Rechts des
    Inventor: Michael Wiedenbeck