Abstract: The invention relates to a picker for electronic components (24, 25, 26), more particularly for picking and subsequently testing the components (24, 25, 26). The picker comprises a fixed feed rail (11) for accommodating a plurality of components (24, 25, 26) arranged juxtaposed in a row as well as a conveyor unit (17) arranged at an exit opening (43) of the feed rail (11) and perpendicularly shiftable thereto. The conveyor unit comprises a window (27) suitable for receiving a single component (24, 25, 26).