Patents Assigned to HennyZ B.V.
  • Patent number: 11994663
    Abstract: The present invention is in the field of a vacuum transfer assembly, such as for cryotransfer, and specifically a TEM vacuum transfer assembly, which can be used in microscopy, a sample holder, a vacuum housing, a sample holder stage and a sample holder coupling unit for use in the assembly, and a microscope comprising said assembly as well as a method of vacuum transfer into a microscope.
    Type: Grant
    Filed: January 7, 2019
    Date of Patent: May 28, 2024
    Assignee: HENNYZ B.V.
    Inventor: Hendrik Willem Zandbergen
  • Patent number: 11041788
    Abstract: The present invention is in the field of a cryo transfer system for use in microscopy, and a microscope comprising said system. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein a specimen (or sample) is cooled or needs cooling.
    Type: Grant
    Filed: July 12, 2018
    Date of Patent: June 22, 2021
    Assignee: HennyZ B.V.
    Inventor: Hendrik Willem Zandbergen
  • Publication number: 20200141846
    Abstract: The present invention is in the field of a cryo transfer system for use in microscopy, and a microscope comprising said system. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein a specimen (or sample) is cooled or needs cooling.
    Type: Application
    Filed: July 12, 2018
    Publication date: May 7, 2020
    Applicant: HennyZ B.V.
    Inventor: Hendrik Willem ZANDBERGEN