Patents Assigned to Hermes Testing Solutions Inc.
  • CMOS image sensor test probe card
    Patent number: 8358146
    Abstract: A CIS test probe card with an optic assembly is disclosed. At least one embodiment relates to the optic assembly being located close to the CIS test probe card to collimate a light before it is projected through the CIS test probe card to the wafer. At least one embodiment relates to a change in the geometric configuration of the hole(s) and the probe(s) in the CIS test probe card. Small holes corresponding to the CIS chips in a one-on-one fashion can be implemented, such that each small hole is located over a corresponding CIS chip.
    Type: Grant
    Filed: October 14, 2009
    Date of Patent: January 22, 2013
    Assignee: Hermes Testing Solutions Inc.
    Inventor: Chien-Yao Hung