Abstract: A microelectromechanical system (MEMS) motion sensor is disclosed for detecting movement in three dimensions of a semiconductor wafer structure. The MEMS device has top, middle, and bottom layers, with a mover attached to the middle layer by a flexure that allows the mover to move in three dimensions relative to the layers. The mover has mover electrodes that create a capacitance with counter electrodes positioned on an adjacent layer. The capacitance changes as the mover moves. A capacitance detector receives signals from the electrodes and detects movement of the mover based on the change in capacitances. The MEMS device processes the detected capacitances to determine the nature of the movement of the mover. The mover and counter electrodes comprise x-y electrodes for detecting movement in an x-y plane parallel to the middle layer and z electrodes for detecting movement in a direction orthogonal to the x-y plane.

Abstract: A multiple media sheet stack selection mechanism for selectively presenting multiple media sheet stacks to the same sheet separation and feed mechanism. The multiple media stack selection mechanism includes a primary sheet holder and at least one secondary stack holder. In the first embodiment, the multiple media stack selection mechanism includes a rotatable feed arm mechanism for holding the second paper stack and for positioning the second paper stack for picking and advancement. In the second embodiment, the multiple media sheet stack selection mechanism includes a paper stack gripping device for holding a second paper stack and for positioning the second paper stack for picking and advancement. In both the first and second embodiment, the paper stacks are positioned at a near vertical angle. The near vertical angle provides additional advantages in that the gravity force assists in constantly urging the sheets toward the feed zone, and results in a greater feed reliability.