Patents Assigned to Hexagon Metrology AB
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Publication number: 20110107613Abstract: An articulated arm CMM system comprises an articulated arm comprising a plurality of articulated arm members, a measuring probe at a distal end, and a base at a proximal end, the base comprising a docking portion. The articulated arm CMM system also includes a plurality of feature packs configured to electronically connect to the articulated arm via the docking portions and provide additional electronic functionality.Type: ApplicationFiled: March 26, 2010Publication date: May 12, 2011Applicant: HEXAGON METROLOGY ABInventor: Hogar Tait
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Publication number: 20110107611Abstract: A method of operating an articulated arm CMM is provided. Instructions for the CMM can be inputted to the CMM arm by an action chosen from the group consisting of placing the arm in a predefined position and moving the arm in a predefined manner.Type: ApplicationFiled: March 26, 2010Publication date: May 12, 2011Applicant: HEXAGON METROLOGY ABInventors: Laurent Desforges, Jean-Paul Delemos
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Publication number: 20110107614Abstract: A coordinate measurement device comprises an articulated arm and a laser scanner assembly. The articulated arm can have a first end, a second end, and a plurality of jointed arm segments therebetween. Each arm segment can define at least one axis of rotation, and a last axis of rotation can be defined by bearings near a distal end of the arm. The laser scanner assembly can couple to the distal end of the arm. The arm can continuously generate trigger signals that are received by the laser scanner and indicate a time at which the arm's position is measured.Type: ApplicationFiled: March 26, 2010Publication date: May 12, 2011Applicant: HEXAGON METROLOGY ABInventor: Peter Champ
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Publication number: 20110112786Abstract: A method of operating an articulated arm CMM is provided. One or more coordinates on an object can be measured with the articulated arm CMM. At least one of the encoders can then be at least partially powered-off. The encoder can then be powered on and one or more coordinates on the same object can be measured without recalibrating the encoder.Type: ApplicationFiled: March 26, 2010Publication date: May 12, 2011Applicant: HEXAGON METROLOGY ABInventors: Laurent Desforges, Heinz Lippuner, Knut Siercks, Thibault Duportal, Denny Roux, Jean-Luc Famechon
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Publication number: 20110107612Abstract: An articulated arm CMM comprises a plurality of transfer members, a plurality of articulation members connecting at least two transfer members to each other, a coordinate acquisition member at a distal end, and a base at a proximal end. At least two of the articulation members can include at least one encoder and the at least two encoders can both be enclosed within a single monoblock housing.Type: ApplicationFiled: March 26, 2010Publication date: May 12, 2011Applicant: HEXAGON METROLOGY ABInventors: Paul Ferrari, Thibault Duportal, Elie Shammas, Jerry Gerent, Dongmei Hong, Denny Roux
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Patent number: 7913537Abstract: An adjustment arrangement for a measuring head, in particular an adjustment arrangement in order to simplify the calibration of a measurement probe (3) supported by a measuring head in a coordinate measuring machine, where the adjustment arrangement includes an element for the determination of the measured position of the probe ball (7), and where an element is arranged to turn or displace, or both, the probe ball in order to determine a newly measured position of the probe ball, whereby the offset of the probe ball (7) can be determined.Type: GrantFiled: November 15, 2006Date of Patent: March 29, 2011Assignee: Hexagon Metrology ABInventor: Bo Petterson
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Patent number: 7895761Abstract: A measurement method and a measuring device for use in measurement systems such as co-ordinate measurement machines and similar, where a position sensor is arranged to register its position in order to determine the form and dimensions of an object. The position sensor is supported by a support, the position and orientation of which are determined through calculation with the aid of data from at least one of accelerometers, GPS receivers and gyroscopes, and based on a known starting position.Type: GrantFiled: August 3, 2006Date of Patent: March 1, 2011Assignee: Hexagon Metrology ABInventor: Bo Pettersson
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Publication number: 20110037989Abstract: A measurement arrangement with a measurement head (1) in order to carry out accurate measurements of objects that are to be subject to inspection measurement during, for example, a manufacturing process, whereby the measurement arrangement includes at least one mobile support and one measurement head (1) arranged at the end of the mobile support and including a measurement probe (2) that can be swivelled (B) and set at an angle (A) relative to the mobile support.Type: ApplicationFiled: January 30, 2009Publication date: February 17, 2011Applicant: HEXAGON METROLOGY ABInventor: Bo Pettersson
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Publication number: 20100325907Abstract: An articulated arm system can include an articulated measuring arm with a plurality of interconnected support arm segments. The arm segments can be moveable about a plurality of axes. A plurality of rotational angle sensors can mount on the arm and be configured to measure rotational position between the support arm segments. Additionally, a vibration detection device can attach to the arm near an end of the arm. The vibration detection device can be operatively connected to the sensors such that the sensors output a rotational position upon detection of a new vibration exceeding a threshold amplitude.Type: ApplicationFiled: June 28, 2010Publication date: December 30, 2010Applicant: HEXAGON METROLOGY ABInventor: Hogar Tait
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Publication number: 20100257746Abstract: In one embodiment, a coordinate measurement apparatus includes an articulated arm having a first end and a second end with at least a first arm segment and a second arm segment therebetween. Further, the apparatus can comprise at least one ball and socket joint connecting the first arm segment to the second arm segment, with the ball and socket joint including a ball member and a socket member, and a measurement probe attached to the first end of said articulated arm.Type: ApplicationFiled: June 24, 2010Publication date: October 14, 2010Applicant: HEXAGON METROLOGY, ABInventors: Homer L. Eaton, Paul A. Ferrari
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Patent number: 7779553Abstract: A method for scanning a surface of a workpiece using a scanning probe 2 mounted on a support 3 on a coordinate measuring machine 4. The support contains drive means 5, 7 for actuating the movement of the scanning probe 2 relatively to the support 3. The method further involves detecting means 9 to measure a contact force F applied between the tip 10 of the probe and the surface 1, control means 13 coupled to the drive means, and memory means 14 for storing theoretical profiles 19 and coordinates 20 of the surface. This method is characterized by the fact that the control means 13 adjust the actuation of the drive means 5, 7 along a scanning path 18 in order to maintain the contact force 11 within the defined range of values 15 during the whole scanning operation along the scanning path 18.Type: GrantFiled: March 17, 2008Date of Patent: August 24, 2010Assignee: Hexagon Metrology ABInventors: Pascal Jordil, Bo Pettersson, Siercks Knut
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Publication number: 20100208062Abstract: A method and a device for the accurate measurement of objects, where, according to the invention, a camera (4) is arranged on a manually operated portable jointed arm (1) in order to take two-dimensional images of the object that is to be measured and where the measurements are carried out based on the two-dimensional images taken with the camera (4) and based on the displacements that are carried out by the jointed arm (1) during the measurements.Type: ApplicationFiled: April 2, 2008Publication date: August 19, 2010Applicant: HEXAGON METROLOGY ABInventor: Bo Pettersson
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Patent number: 7774949Abstract: A portable coordinate measurement machine having three articulating arm transfer members can provide accurate measurements. The transfer members can be single tube assemblies. The transfer members can each be rotatably joined by relatively short articulating joint assemblies allowing relative rotation of adjacent transfer members about two degrees of freedom. Encoders can be used to measure the relative rotation about each of the degrees of freedom, and signals from the encoders can be digitized by processor boards positioned within the transfer members. Processor boards can be placed in tandem in the transfer members, and one or more of the processor boards can be mounted on a rotatable assembly. Slip rings can electrically couple all of the processor boards to allow for infinite rotatability of the articulating arm.Type: GrantFiled: September 28, 2007Date of Patent: August 17, 2010Assignee: Hexagon Metrology ABInventor: Paul Ferrari
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Patent number: 7743524Abstract: In one embodiment, a coordinate measurement apparatus includes an articulated arm having a first end and a second end with at least a first arm segment and a second arm segment therebetween. Further, the apparatus can comprise at least one ball and socket joint connecting the first arm segment to the second arm segment, with the ball and socket joint including a ball member and a socket member, and a measurement probe attached to the first end of said articulated arm.Type: GrantFiled: November 20, 2007Date of Patent: June 29, 2010Assignee: Hexagon Metrology ABInventors: Homer L. Eaton, Paul A. Ferrari
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Patent number: 7712224Abstract: Validating the error map of a CMM using a calibrated probe including a stylus, the probe capable of rotation about at least one axis, includes placing a calibration artifact on a table of the CMM, the table having an upper surface in an XY plane; positioning a Z-ram of the CMM in a first calibration position and a second calibration position with respect to the artifact such that the stylus contacts the artifact; calculating a measured value representing the measured length between the first and second calibration positions; calculating a nominal value based on the length of the stylus of the probe; comparing the nominal value to the measured value; and updating the error map of the CMM if the measured value differs from the nominal value by more than a predetermined value. The probe and/or the stylus moves relative to the Z-ram such that the calibration artifact remains stationary while the Z-ram is positioned in the first calibration position and the second calibration position.Type: GrantFiled: October 3, 2007Date of Patent: May 11, 2010Assignee: Hexagon Metrology ABInventor: Peter Hicks
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Publication number: 20100078866Abstract: A method of measuring the forces that arise in a processing machine when processing is carried out and compensating geometrical errors caused by these forces, where a workpiece holder (10) is arranged to measure the forces and such that it can be adjusted based on measurement signals that have been received, by it being possible to turn the workpiece holder relative to a fixture (11) in the processing machine to which the workpiece holder is attached. An arrangement for the realization of the method, includes a workpiece holder (10) the angle of which can be adjusted relative to a fixture (11) in the processing machine to which the workpiece holder (10) is connected, and where the force measuring elements (13) are arranged to measure the forces that are exerted on the workpiece holder (10).Type: ApplicationFiled: November 16, 2007Publication date: April 1, 2010Applicant: HEXAGON METROLOGY ABInventor: Bo Pettersson
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Patent number: 7676942Abstract: The positioning and measuring system includes a coordinate positioning machine comprising a movable spindle (60) movable relative to a reference surface 30, a rotor (100) rotatably connected with the movable spindle, an actuator (500) for driving the rotor (100) in rotation around a rotation axis (65), and a coordinate probe (150, 190) detachably connectable to the rotor (100) for measuring coordinate of points (350) of a workpiece (200, 201, 250) along a path resulting from the composition of a translation movement of the spindle (60) and a rotation of the rotor (100). The points (350) are offset (r) with respect to the rotation axis (65) of the rotor (100).Type: GrantFiled: March 13, 2008Date of Patent: March 16, 2010Assignee: Hexagon Metrology ABInventors: Pascal Jordil, Siercks Knut, Bo Pettersson, Klaus Schneider
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Patent number: 7669344Abstract: A single-scale, single-drive coordinate measuring machine that compensates for hysteresis error caused by friction at the non-driven end of the bridge. The coordinate measuring machine is calibrated to estimate hysteresis effects at one or more distances from the scale. Measurements of workpieces are adjusted based on the calibration data and the distances of the carriage from the scale at the point of the measurements. The scale and the drive system may be positioned on opposite guideways.Type: GrantFiled: June 14, 2007Date of Patent: March 2, 2010Assignee: Hexagon Metrology ABInventors: Richard MacManus, Bruce R. Pease
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Publication number: 20100042246Abstract: A method to compensate geometrical errors in processing machines, in which a workpiece holder (8) is arranged such that it can be adjusted on the basis of measurement signals that have been received by being able to be rotated relative to a fixture (9) in the processing machine to which the workpiece holder is attached. A method for the alignment of a workpiece in processing machines, and an arrangement for the realization of the method are disclosed. The arrangement includes a workpiece holder (8), the angle of which relative to a fixture (9) in the processing machine to which the workpiece holder (8) is connected can be adjusted.Type: ApplicationFiled: November 16, 2007Publication date: February 18, 2010Applicant: HEXAGON METROLOGY ABInventor: Bo Pettersson
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Patent number: 7647706Abstract: A method for scanning a surface of a workpiece 1 at a constant scanning speed /va/ using a scanning probe 2 mounted on a support 3 on a coordinate measuring machine (CMM) 4. The CMM contains a first set of drive means (6, 7, 8) to move the support according to three linear axis (x,y,z), and the support 3 contains a second set of drive means (14, 17) for actuating the movement of the scanning probe 2 with two degrees of freedom relative to said support 3. The method involves control means 33 coupled to the sets of drive means (6, 14, 17), and memory means for storing theoretical profiles and coordinates of the surface to scan.Type: GrantFiled: March 21, 2008Date of Patent: January 19, 2010Assignee: Hexagon Metrology ABInventors: Pascal Jordil, Siercks Knut, Bo Pettersson, William Wilcox