Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.
Type:
Grant
Filed:
June 2, 2017
Date of Patent:
January 1, 2019
Assignee:
Hinds Instrumsnts, Inc.
Inventors:
John Freudenthal, Andy Leadbetter, Baoliang Wang