Abstract: Disclosed are a semiconductor device comprising a semiconductor substrate, a first metal connection layers, a first substrate oxide layer having a specific form, and a second connection pattern layer; a process for producing the device; and a microwave plasma treatment apparatus having gas feed ports in a specific position. The highly reliable semiconductor devices can be produced at a high rate at high yields.
Type:
Grant
Filed:
March 26, 1992
Date of Patent:
September 13, 1994
Assignees:
Hitachi, Ltd., Hitachi Engineering & Services, Inc.