Patents Assigned to Hitachi High-Tech Analytical Science Limited
  • Patent number: 10876888
    Abstract: An optical spectrometer arrangement is provided. According to an example, the optical spectrometer arrangement comprises a linear array detector for receiving light at a predefined range of wavelengths, a point detector for receiving light at a predefined wavelength that is outside said predefined range of wavelengths, and an arrangement of a collimating optical element, a diffracting optical element, and a focusing optical element that are arranged to provide at least a first optical path that guides incoming light at said predefined range of wavelengths to the linear array detector via the collimating optical element, the diffracting optical element and the focusing optical element, and a second optical path that guides incoming light at said predefined wavelength to the point detector via the collimating optical element, the diffracting optical element and one of the collimating optical element and the focusing optical element.
    Type: Grant
    Filed: March 6, 2018
    Date of Patent: December 29, 2020
    Assignee: Hitachi High-Tech Analytical Science Limited
    Inventors: Tuomas Pylkkanen, Esa Raikkonen
  • Patent number: 10527496
    Abstract: According to an example embodiment, a detector assembly for use in analysis of elemental composition of a sample by using optical emission spectroscopy is provided, the detector assembly comprising a rotatable element that is rotatable about an axis and that has attached thereto a laser source for generating laser pulses for invoking optical emission on a surface of the sample, which laser source is arranged to generate laser pulses focused at a predefined distance from said axis at a predefined distance from a front end of the detector assembly, and an optical receiver for capturing optical emission invoked by said laser pulses.
    Type: Grant
    Filed: November 13, 2018
    Date of Patent: January 7, 2020
    Assignee: Hitachi High-Tech Analytical Science Limited
    Inventor: Jukka Hassi
  • Patent number: 10197445
    Abstract: According to an example embodiment, a detector assembly for use in analysis of elemental composition of a sample by using optical emission spectroscopy is provided, the detector assembly including a rotatable element that is rotatable about an axis and that has attached thereto a laser source for generating laser pulses for invoking optical emission on a surface of the sample, the laser source arranged to generate laser pulses focused at a predefined distance from said axis at a predefined distance from a front end of the detector assembly, and a detector element for capturing optical emission invoked by said laser pulses.
    Type: Grant
    Filed: May 30, 2017
    Date of Patent: February 5, 2019
    Assignee: Hitachi High-Tech Analytical Science Limited
    Inventor: Jukka Hassi
  • Patent number: 10101210
    Abstract: A portable analyzer determines composition of a sample and includes excitation means for invoking an optical emission from a surface of the sample, detector means for observing a selectable wavelength in said optical emission and for recording a detection signal that is descriptive of at least one characteristic of said optical emission at a selected wavelength, analysis means for determination of elemental composition of the sample on basis of one or more detection signals; and control means for carrying out a spectral analysis by operating the excitation means to generate the optical emission for recording respective detection signals at predefined wavelengths, operating the detector means to record the respective one or more detection signals at said one or more predefined wavelengths, and operating the analysis means to determine elemental composition of the sample on basis of said recorded detection signals.
    Type: Grant
    Filed: November 23, 2016
    Date of Patent: October 16, 2018
    Assignee: Hitachi High-Tech Analytical Science Limited
    Inventor: Tuomas Pylkkanen